Semiconductor Data Strobe Path Selector for Test Pin Reduction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
As semiconductor technology advances, the increasing number of data input/output pads and corresponding data strobe signals necessitates a greater number of test pins, leading to higher testing costs and reduced competitiveness due to longer testing times.
Innovation Solution
A semiconductor device with a path selector that allows data strobe signals to be shared among multiple input paths during testing, using a minimum number of test pins and adapting to different data width options by selectively routing data strobe signals through various paths based on path selection signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of data input/output pads increases to support higher data widths, then the data transmission capability is improved, but the number of test pins required increases leading to longer testing time and higher costs
Solution Approach 1:
The data strobe signal pad is designed to serve multiple functions: during normal operation it synchronizes data for specific data input/output pads, while during test operation it can be shared by multiple data input/output pads through the path selector. This multi-functionality allows a single pad to support testing of increased data widths without proportionally increasing the number of test pins required.
Solution Approach 2:
The path selector dynamically reconfigures the signal routing based on operation mode. During normal operation, each data strobe signal is routed to its dedicated data input/output pads. During test operation, the path selector redirects data strobe signals to be shared by multiple data input/output pads, enabling flexible adaptation to different testing requirements without hardware changes.
2Measurement precision
If dedicated data strobe signal pads are provided for each data input/output pad, then data synchronization accuracy is improved, but device complexity and testing cost increase
Solution Approach 1:
The path selector acts as an intermediary component between the data strobe signal pads and the data input/output pads. It intelligently routes signals based on operation mode, allowing the system to maintain simple pad structures while achieving accurate data synchronization through proper signal distribution control.
3Reliability
If more test pins are used to test all data strobe signals, then testing completeness is improved, but testing time and cost increase
Solution Approach 1:
During test operation, the path selector merges the testing function of multiple data strobe signals into a single pad. By routing multiple data strobe signals through one pad, the system achieves complete testing coverage while reducing the number of test pins required, thereby improving testing efficiency without sacrificing reliability.
Data Source
AI summary
A semiconductor device includes a pad configured to receive a data strobe signal, and a path selector configured to output the data strobe signal through a corresponding input path during a normal operation, and to output the data strobe signal through a plurality of input paths in response to a path selection signal during a test operation.