Stroboscopic Stepped Illumination for Micron Defect Detection
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Solution Overview
Problem
Existing machine vision defect detection systems for 3C consumer electronic products face challenges in accurately detecting micron-level defects due to limitations in camera resolution, motion compensation, and inefficient use of light sources, leading to restricted types and numbers of detectable defects.
Innovation Solution
A stroboscopic stepped illumination defect detection system utilizing multiple cameras and collaboratively operating light sources, which employs stroboscopic stepped control to adjust pulse widths and current values of light sources, allowing for multi-directional imaging and improved defect detection capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a line scan camera with fixed shooting speed and fixed light source current is used, then the system structure is simple, but the types and number of detectable defects are limited
Solution Approach 1:
The patent applies dynamics by making the light source current variable rather than fixed. The system dynamically adjusts the driving current of the light source according to different detection needs, enabling the same hardware configuration to detect multiple types of defects (scratch, dent, black spot, foreign matter) with varying illumination requirements.
Solution Approach 2:
The patent changes the electrical parameter (driving current) of the light source to achieve different illumination intensities and characteristics. By adjusting the current parameter, the system can optimize lighting conditions for detecting different defect types without changing the physical hardware configuration.
2Adaptability or versatility
If multiple light sources are used to detect different defects, then the detectable defect types increase, but the light source utilization rate becomes low
Solution Approach 1:
The patent makes a single light source perform multiple functions by adjusting its driving current. The same light source can detect scratch defects at one current level, dent defects at another current level, and black spot or foreign matter defects at yet another current level, eliminating the need for multiple dedicated light sources.
Solution Approach 2:
The patent merges the functions of multiple light sources into a single light source by implementing stroboscopic stepped illumination with variable current control. This consolidation reduces the number of light sources needed while maintaining the capability to detect all defect types.
3Adaptability or versatility
If more light sources and cameras are added to increase detection capability, then the detectable defect types and number increase, but the system cost and complexity increase
Solution Approach 1:
The patent makes each light source and camera in the system perform multiple detection functions through variable current control and stroboscopic illumination. A single camera can capture images under different lighting conditions created by varying the light source current, reducing the need for multiple specialized cameras.
Solution Approach 2:
The system dynamically controls the light source current in steps, creating different illumination conditions sequentially. This dynamic control allows the same hardware to adapt to different detection requirements, reducing the total number of components needed.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves enhanced detection accuracy for micron-level defects, increases the types and number of detectable defects, and improves the utilization rate of light sources, thereby surpassing the capabilities of traditional systems that require 4-8 cameras.
Implementation Method 1
a light source, configured to emit light according to the stroboscopic stepped control signal
Implementation Method 2
an image extraction unit configured to acquire pictures of the product under the stroboscopic illumination
Data Source
AI summary
A stroboscopic stepped illumination defect detection system for appearance defect detection of a product is provided. The system includes an image extraction unit, a brightness adjustment unit, a data processing unit, and a stroboscopic control unit. The image extraction unit is connected to the stroboscopic control unit and used for obtaining stable and clear images in various transmission/reflection visual bright fields/dark fields; and the brightness adjustment unit is connected to the stroboscopic control unit and used for setting various transmission/reflection visual bright fields/dark fields and converting in the various transmission/reflection visual bright fields/dark fields.