Substrate Bevel Cleaning With Torque-Based Contact Detection

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Solution Overview

Problem

Existing substrate cleaning technologies face challenges in effectively cleaning the bevels of substrates due to wear and varying positional relationships between the cleaning tools and substrates, leading to incomplete cleaning.

Innovation Solution

A substrate cleaning apparatus equipped with a contact detection mechanism using a torque sensor to detect contact between the cleaning tool and the substrate, allowing precise movement and adjustment of the cleaning tool to ensure thorough cleaning, and a self-cleaning mechanism for maintaining tool effectiveness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the cleaning tool position is fixed relative to the substrate, then the device structure is simple, but cleaning quality deteriorates due to wear and positional variations

Engineering Contradiction:
Improvecleaning qualityVSAvoiddevice structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The cleaning tool is made movable along the substrate radial direction through a driving mechanism, allowing dynamic adjustment of the cleaning tool position relative to the substrate. This enables compensation for wear and positional variations, maintaining cleaning quality without requiring an overly complex fixed-position system

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

A detection mechanism detects the actual position relationship between the cleaning tool and substrate, providing feedback to the control system. The control system then adjusts the cleaning tool position via the driving mechanism to maintain optimal cleaning contact, resolving the contradiction between simple structure and high cleaning precision

Inventive Principle:
Principle #23Feedback

2Reliability

If the cleaning tool moves closer to the substrate to ensure contact, then cleaning effectiveness improves, but the risk of excessive force or damage increases

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidexcessive force or damage
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The detection mechanism continuously monitors the contact state between the cleaning tool and substrate, providing real-time feedback to the control system. When contact is detected or excessive force is anticipated, the system automatically adjusts the cleaning tool position to maintain optimal contact pressure, ensuring cleaning effectiveness while preventing damage

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The control system proactively adjusts the cleaning tool position based on detected trends or predetermined conditions before excessive force or damage can occur. This preliminary anti-action prevents harmful effects while maintaining reliable cleaning contact

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures reliable and efficient cleaning of substrate bevels by accurately detecting contact and adjusting tool position, even with wear, and maintains cleaning tool effectiveness through self-cleaning, thereby improving cleaning quality.

Implementation Method 1

a contact detection means that detects contact between the cleaning tool and the bevel of the substrate

Methodology Applied
Scientific EffectTorque: Torque

Data Source

PatentUS20250276347A1Substrate cleaning apparatus, substrate processing apparatus, substrate cleaning method, cleaning method for cleaning tool, a non-transitory computer-readable storage medium storing, a substrate cleaning program and a non-transitory computer-readable storage medium storing a cleaning program
Publication Date: 2025.09.04 EBARA CORP
  • US20250276347A1 patent drawing
  • US20250276347A1 patent drawing
  • US20250276347A1 patent drawing

AI summary

Provided is a substrate cleaning apparatus including: a substrate holding and rotating mechanism that holds and rotates a substrate; a cleaning tool that cleans a bevel of the substrate; a contact detection means that detects contact between the cleaning tool and the bevel of the substrate; and a cleaning tool moving mechanism that moves the cleaning tool toward the bevel of the substrate until the contact is detected in a state where the substrate is being rotated.