Metal Substrate Cleanliness Scoring for Additive Forging Bonding

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Solution Overview

Problem

Current methods for evaluating substrate surface cleanliness in additive forging are inadequate, particularly in detecting and quantifying a combination of oil, particulate, and chip contaminants, leading to poor bonding performance.

Innovation Solution

A method involving X-ray energy spectrum analysis, ultra-depth-of-field microscopy, water droplet contact angle, and optical observation to identify and quantify contaminants, assigning weight coefficients based on their impact on bonding, and calculating a cleanliness level through a weighted contamination score.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If SITA CleanoSpector with UV fluorescence detection is used to evaluate surface cleanliness, then the detection process is simple and fast, but it can only detect oil contaminants and cannot detect particulate and chip contaminants

Engineering Contradiction:
Improvedetection process simplicityVSAvoidcontaminant detection capability
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The patent divides the surface cleanliness evaluation into three separate detection systems, each targeting a specific contaminant type: fluorescence detection for oil contaminants, microscopy for particulate contaminants, and particle counters for chip contaminants. This segmentation allows each system to be optimized for its specific detection task while collectively providing comprehensive contaminant coverage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates a multi-functional evaluation system that combines three different detection methods into one comprehensive surface cleanliness evaluation platform. This universal system can detect and evaluate all three major contaminant types (oil, particles, chips) that affect additive forging bonding, making it applicable to the specific needs of metal substrate additive forging processes.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If particle counter method is used to evaluate surface cleanliness, then particulate contaminants can be detected and quantified, but oil contaminants and tightly adsorbed solid particle contaminants cannot be detected

Engineering Contradiction:
Improveparticulate contaminant quantificationVSAvoidcontaminant type coverage
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent segments the detection tasks by assigning different detection methods to different contaminant types. Particle counters are used specifically for chip contaminants where they excel at quantification, while fluorescence detection handles oil contaminants and microscopy handles particulate contaminants. This segmentation ensures each method operates in its optimal performance range.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces intermediate detection methods (fluorescence detection and microscopy) that bridge the gaps left by particle counters. These intermediary methods detect contaminant types that particle counters cannot detect, creating a complementary detection network where each method compensates for the limitations of the others.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If AK225 solution solubility method is used to detect surface contaminants, then organic contaminants can be detected through weighing, but solid particle contaminants that are tightly adsorbed and insoluble cannot be detected

Engineering Contradiction:
Improveorganic contaminant quantificationVSAvoidinsoluble contaminant detection failure
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent introduces fluorescence detection and microscopy as intermediary methods that can detect insoluble particulate contaminants which the AK225 solution method cannot detect. These intermediary detection methods provide alternative pathways for identifying and quantifying contaminant types that are resistant to chemical dissolution.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the chemical-based AK225 solution dissolution method with physical-based detection methods (fluorescence detection and microscopy) for detecting particulate and chip contaminants. This substitution allows detection of contaminants that do not dissolve in chemical solutions by using optical and physical measurement principles instead.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Device complexity

If a single contaminant detection method is used, then the detection system is simple, but it cannot accurately evaluate surfaces with multiple contaminant types coexisting

Engineering Contradiction:
Improvedetection system structureVSAvoidmulti-contaminant evaluation accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the detection system into three independent detection subsystems, each optimized for a specific contaminant type. This segmentation maintains relative simplicity within each subsystem while achieving high overall accuracy for multi-contaminant evaluation through the combination of specialized detectors.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates a composite detection system that integrates three different detection methodologies (fluorescence detection, microscopy, and particle counting) into a unified evaluation framework. This composite approach combines the strengths of each detection method to achieve comprehensive and accurate surface cleanliness evaluation for additive forging substrates.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Provides an accurate and systematic evaluation of substrate cleanliness, ensuring effective bonding by quantifying the influence of various contaminants on the interface, thereby improving the quality of additive forging.

Implementation Method 1

a small sample is machined with the same machining parameters, a part of the surface of the small sample is detected with an X-ray energy spectrum analyzer in a surface scanning mode

Methodology Applied
Scientific EffectX-ray energy spectrum analysis: X-Ray

Implementation Method 2

a water droplet contact angle method is then used to detect the oil contaminant

Methodology Applied
Scientific EffectContact angle measurement: Wetting

Data Source

PatentUS12449376B2Method for evaluating substrate surface cleanliness oriented to additive forging
Publication Date: 2025.10.21 DALIAN UNIV OF TECH
  • US12449376B2 patent drawing

AI summary

A method for evaluating a surface cleanliness oriented toward additive forging of a metal substrate employs weight coefficients corresponding to oil contaminants, particles and chips. Contamination scores of different contaminants are determined separately by different methods, and a surface cleanliness thereof is characterized in a quantitative manner by calculating the sum of the product of the weight coefficient and the contamination score of each contaminant. Further, an accurate and systematic method for evaluating a surface cleanliness employs weight coefficient of each contaminant determined based on a degree of adverse influence of the contaminant on the interface bonding of a substrate. Different detection methods are used for different contaminants. The contamination score of each contaminant is determined by the sum of the product of the weight coefficient and the contamination score of the corresponding contaminant, the comparison relationship is thus established, a cleanliness level is finally determined.