Substrate Process Flow Flags for Flexible Site Sequence Control
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Solution Overview
Problem
The existing substrate processing methods face difficulties in optimizing process flag control logic, especially when the number of cycles increases, leading to complex coding and inconvenience in modifying processes, particularly in TFT manufacturing where specific sequence flows are critical.
Innovation Solution
A substrate processing method that utilizes an operation list with an operation site bar, inspection site bar, and operation flag record enabling bar to manage operation site flags and inspection site flags, ensuring that substrates undergo the correct process flows by verifying matching flags before processing, thereby preventing incorrect site jumps and optimizing control logic.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of cycles of the process is increased, then the process capability is improved, but the bit number of the process flag is increased and the control logic becomes very difficult for coding
Solution Approach 1:
The patent segments the process control into multiple independent process flows, each with its own process flag. Instead of using one large process flag to track all cycles, the system divides the control into separate process flow identifiers (e.g., first process flow, second process flow) with individual flags for each. This segmentation allows the system to handle multiple cycles without increasing the complexity of a single process flag, as each process flow can be independently controlled and tracked.
2Ease of operation
If a hard code manner is adopted for process flag control, then the control logic can be implemented, but if the process needs to be modified in the future, the program source codes need to be modified
Solution Approach 1:
The patent implements a dynamic process control system where process flows and their associated flags can be configured and modified without changing the underlying program source code. The system uses a configurable process flow definition mechanism that allows operators to add, remove, or modify process flows and their corresponding flags through configuration files or database entries rather than code changes. This dynamic approach enables the system to adapt to process modifications while maintaining the same control framework.
3Ease of manufacture
If reworking is carried out, then the corresponding bit of the process flag will be set to be 0, but the control logic of on/off of the process flag is very difficult for coding
Solution Approach 1:
The patent prepares reworking capability in advance by designing a process flag system that inherently supports rework scenarios. Each process flow is pre-configured with its own process flag, and the system includes predefined logic for handling rework situations. When reworking is needed, the system can reset or modify the appropriate process flag for the specific process flow without requiring complex conditional logic or bit manipulation, as each process flow's rework handling is independently prepared and configured.
Data Source
AI summary
A substrate processing method includes loading an operation list of a substrate, the operation list including an operation site bar, an inspection site bar, and an operation flag record enabling bar, the operation site bar including a plurality of operation site flags, and the inspection site bar including an inspection site flag; loading a substrate onto a production line; inquiring an operation site flag corresponding to the operation site at the operation site bar of the operation list, and judging whether the operation site flag is provided with an inspection site flag at the inspection site bar; if the operation site flag is provided with the inspection site flag at the inspection site bar, verifying whether a current operation flag of the substrate matches the inspection site flag; if the current operation flag of the substrate matches the inspection site flag, processing the substrate at the operation site.


