Substrate Processing Apparatus Particle Suppression

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Solution Overview

Problem

The generation of particles in the process chamber during semiconductor device manufacturing, caused by deposits on chamber members, leads to reduced film quality due to foreign materials and quality control issues.

Innovation Solution

A technique involving a substrate processing apparatus where the substrate is supported by a heater-equipped mounting table, with specific gas supply and positioning strategies to minimize particle generation, including a modification process to convert deposits into a strong, high-density substance using reactive gases like O2, and a cleaning process using F2 gas to remove accumulated deposits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the substrate is processed in the process chamber using processing gas, then film forming is achieved, but deposits are attached onto members in the process chamber causing particles and reducing film quality

Engineering Contradiction:
Improvefilm qualityVSAvoidparticle generation
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The mounting table is moved to a higher position (second position) before the film forming process to prevent deposit accumulation on chamber members. This preliminary positioning action prevents the harmful effect of particle generation before it occurs during substrate processing

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The heater on the mounting table is utilized to heat the ceiling portion of the process chamber during reactive gas supply. This converts the heating function into a beneficial tool for modifying deposits and converting them into stable substances that are less likely to generate particles

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Manufacturing precision

If the heater is turned on continuously to maintain substrate temperature, then film forming quality is improved, but energy consumption increases

Engineering Contradiction:
Improvefilm forming qualityVSAvoidheater energy consumption
Core Design Contradiction:
Manufacturing precisionVSUse of energy by moving object

Solution Approach 1:

The heater operation is made periodic rather than continuous. The heater is turned on during reactive gas supply to modify deposits, and turned off during substrate processing when temperature maintenance is sufficient. This periodic operation reduces energy consumption while maintaining film forming quality

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The heater control is dynamically adjusted based on the mounting table position and process stage. The heater operates at different power levels or states depending on whether the table is in the first or second position, optimizing energy usage according to actual process needs

Inventive Principle:
Principle #15Dynamics

3Object-generated harmful factors

If cleaning is performed frequently to remove deposits, then particle generation is suppressed, but productivity decreases due to process interruption

Engineering Contradiction:
Improveparticle suppressionVSAvoidprocessing efficiency
Core Design Contradiction:
Object-generated harmful factorsVSProductivity

Solution Approach 1:

The mounting table position is adjusted preliminarily to prevent deposit accumulation that would require frequent cleaning. By positioning the table higher before processing, the need for frequent cleaning is reduced, thereby maintaining productivity

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Deposits are converted into stable substances through reactive gas supply and heating, transforming the harmful deposits into beneficial protective layers. This conversion reduces the frequency and intensity of cleaning required, maintaining both particle suppression and productivity

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively suppresses particle generation, improves film forming quality, reduces cleaning frequency, and maintains equipment safety and cost-effectiveness by converting deposits into stable substances that are less likely to peel and fall, thereby enhancing operational efficiency.

Implementation Method 1

the heater is turned on

Methodology Applied
Scientific EffectHeating: Heating

Implementation Method 2

supplying a reactive gas into the process chamber... converting deposits into a strong, high-density substance

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 3

cleaning process using F2 gas to remove accumulated deposits

Methodology Applied
Scientific EffectChemical etching:

Implementation Method 4

forming a film on the substrate by supplying a processing gas into the process chamber

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS9640387B2Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
Publication Date: 2017.05.02 KOKUSAI DENKI KK
  • US9640387B2 patent drawing
  • US9640387B2 patent drawing
  • US9640387B2 patent drawing

AI summary

A technique includes loading a substrate into a process chamber, supporting the substrate by a mounting table having a heater therein in the process chamber, forming a film on the substrate by supplying a processing gas into the process chamber in a state where the mounting table having the substrate supported thereon is disposed in a first position and the heater is turned on, unloading the substrate on which the film is formed, and supplying a reactive gas into the process chamber in a state where the mounting table is disposed in a second position and the heater is turned on. The second position is closer to a ceiling portion in the process chamber than the first position.