Substrate Recess Channels for Void-Free Semiconductor Underfill
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Solution Overview
Problem
Semiconductor packages face issues such as delamination, cracking, and moisture-induced defects due to voids in the underfill material between the interposer and package substrate, which affect mechanical integrity and yield.
Innovation Solution
Incorporating recesses in the package substrate surface and channels in their bottom surfaces to accommodate semiconductor devices, ensuring a minimum gap for adequate underfill material flow, enhancing structural coupling and reducing defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If semiconductor devices are mounted directly on the package substrate surface, then device integration is achieved, but voids form in the underfill material causing delamination and cracking
Solution Approach 1:
The package substrate surface is segmented into recess regions and non-recess regions, creating localized depressions beneath each semiconductor device. This segmentation allows the underfill material to properly distribute and bond around the devices without forming voids, while maintaining direct mounting integration.
Solution Approach 2:
The recess regions are formed only in specific locations beneath semiconductor devices, creating local structural modifications rather than uniform changes across the entire substrate. This local quality change enables adequate underfill flow and bonding precisely where needed, improving mechanical integrity without affecting overall device integration.
2Reliability
If the package substrate surface is modified with recesses, then underfill material flow is improved and defects reduced, but manufacturing complexity increases
Solution Approach 1:
The recess regions are formed in the package substrate before the semiconductor devices are mounted. This preliminary action prepares the substrate surface in advance to receive the devices and underfill material, ensuring proper bonding without requiring complex post-assembly modifications.
Solution Approach 2:
The substrate surface geometry is modified by changing the local depth parameter to create recess regions. This parameter change from a flat surface to a stepped surface with controlled depth enables improved underfill flow and bonding while maintaining a relatively simple overall structure.
Data Source
AI summary
Semiconductor packages and methods of fabricating semiconductor packages include a package substrate having a recess formed in a surface of the package substrate and at least one channel in a bottom surface of the recess. The recess may be configured to accommodate a semiconductor device located over a surface of an interposer that is bonded to the package substrate. Accordingly, a minimum gap distance may be maintained between the semiconductor device and the package substrate, which may ensure that sufficient underfill material may flow between the semiconductor device and the package substrate and within the at least one channel, thereby improving of the structural coupling between the interposer and the package substrate, and reducing the likelihood of package defects, such as delamination, cracking, and/or popcorn defects.


