TAP Controller Self-Diagnostics for Precise JTAG Error Localization
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing JTAG testing systems face challenges in accurately determining the source of testing errors when a TAP controller is integrated, as it is difficult to differentiate between errors occurring in the TAP controller and other units within the system.
Innovation Solution
A self-functional detection system for TAP controllers, comprising a TAP controller with an uplink circuit, data transmission hub, power module, protocol conversion circuit, and a DCM circuit, connected to an external function detection module with a complex programmable logic device, allowing for the acquisition and display of voltage, GPIO, and high-speed signals through an API, or the acquisition and display of JTAG signals to identify normal functioning of communication ports and external connections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the TAP controller is integrated into the JTAG testing system, then the testing system can perform comprehensive tests, but it becomes difficult to determine whether errors occurred in the TAP controller or other units
Solution Approach 1:
The patent introduces a self-functional detection system as an intermediary between the TAP controller and external testing devices. This detection system includes a detection controller that interfaces with the TAP controller through predefined protocols, enabling indirect observation and identification of TAP controller functionality without requiring external direct access to internal components.
Solution Approach 2:
The TAP controller performs self-diagnosis through the self-functional detection system. The detection controller executes detection instructions that cause the TAP controller to test its own functional modules (instruction register, data register, state machine, etc.), allowing the system to self-identify errors in specific modules without external intervention into internal operations.
2Reliability
If the TAP controller is integrated into the JTAG testing system, then the system can operate as a complete testing platform, but the problem area where testing errors occur cannot be accurately determined
Solution Approach 1:
The detection system segments the TAP controller's functionality into distinct testable modules including instruction register, data register, state machine, and other functional units. Each module can be independently tested through specific detection instructions, allowing precise identification of which segment contains the error.
Solution Approach 2:
The system implements feedback mechanisms where the detection controller receives test results from the TAP controller's self-diagnosis and uses this information to determine error locations. The feedback loop allows the system to iteratively refine error identification by analyzing responses from different functional modules.
Data Source
AI summary
A self-functional detection system for TAP controller and a method thereof are disclosed. In the system, a TAP controller includes a DCM circuit, and a data device can obtain and display a voltage signal, a GPIO signal and a high-speed signal from the DCM circuit through an API, to implement detection for an internal circuit of the TAP controller. Alternatively, the TAP controller is electrically connected to the external function detection module device, the data device obtains the JTAG signal from the DCM circuit through an API and displays the JTAG signal, so as to detect whether the communication port function of the TAP controller works normally, and further detect whether an external connection of the TAP controller works normally. Therefore, the technical effect of providing self-functional detection of a TAP controller to determine occur point of test error accurately may be achieved.