Telecentric Inspection Apparatus for Surface Reflection Analysis
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Solution Overview
Problem
Current inspection technologies face challenges in accurately assessing the reflection characteristics of objects with varying roughness levels, as they struggle to differentiate between specular and diffuse reflections effectively, leading to inconsistent results and difficulty in identifying surface abnormalities.
Innovation Solution
The inspection apparatus employs a double-sided telecentric lens system with a light emitting unit, aperture unit, and light receiving unit, where the light emitting unit emits irradiation light that is narrowed and condensed by the first and second lenses, and the light receiving unit, positioned between the lenses, captures reflected light to determine reflection characteristics using plural light receiving elements arranged to avoid overlapping with the aperture opening.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional inspection technologies are used, then the inspection process is simple, but the ability to differentiate between specular and diffuse reflections is poor
Solution Approach 1:
The light receiving unit is divided into multiple light receiving elements arranged in specific patterns, allowing separate detection of different reflection components. The aperture unit is segmented into multiple openings arranged in a pattern, enabling selective light reception for specular and diffuse reflections
Solution Approach 2:
The patent introduces angular dimension to light reception by arranging light receiving elements and aperture openings at specific angles and positions. This spatial arrangement enables the system to distinguish between specular and diffuse reflections based on their different reflection angles
2Measurement precision
If conventional inspection technologies are used, then the device structure is simple, but the accuracy in identifying surface abnormalities is low
Solution Approach 1:
Different regions of the inspection apparatus have specialized functions: the aperture unit with multiple openings is optimized for receiving reflected light from specific directions, while the light receiving elements are positioned to detect particular reflection characteristics. This local optimization enables accurate detection of surface abnormalities
Solution Approach 2:
The patent introduces an intermediary optical system comprising the first lens, aperture unit, and second lens that mediates between the light emitting unit and light receiving unit. This intermediary system carefully controls and directs light paths to enable accurate measurement of reflection characteristics
3Measurement precision
If the light receiving unit is positioned to capture reflected light, then reflection characteristics can be measured, but the light receiving elements may overlap with the aperture opening
Solution Approach 1:
The patent employs asymmetric arrangement of light receiving elements relative to the aperture openings. The light receiving elements are positioned at specific locations that do not overlap with the aperture openings, creating an asymmetric configuration that optimizes light reception while avoiding interference
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for precise inspection of reflection characteristics, enabling the differentiation between normal and abnormal surface conditions by analyzing the light receiving results, thereby accurately identifying surface roughness levels and abnormalities.
Implementation Method 1
The first lens changes a divergence level of the irradiation light which is emitted from the light emitting unit and is transmitted through the first lens
Implementation Method 2
The second lens condenses the irradiation light passing through the opening, toward the object
Implementation Method 3
the light receiving unit includes plural light receiving elements which receives reflected light obtained by the irradiation light being emitted to the object and then being transmitted through the second lens
Data Source
AI summary
An inspection apparatus includes a light emitting unit, a first lens, an aperture unit, a second lens, a light receiving unit, and an inspection unit. The light emitting unit emits irradiation light to an object to be inspected. The first lens changes a divergence level of the irradiation light which is emitted from the light emitting unit and is transmitted through the first lens. The aperture unit has an opening which narrows the irradiation light transmitted through the first lens. The second lens condenses the irradiation light passing through the opening, toward the object. The light receiving unit is disposed between the aperture unit and the second lens. The light receiving unit includes plural light receiving elements which receives reflected light obtained by the irradiation light being emitted to the object and then being transmitted through the second lens.