TEM Holder Capsule Sealing for Air-Sensitive Sample Transfer

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Solution Overview

Problem

Existing sample transfer systems for transmission electron microscopes (TEMs) fail to protect air-sensitive samples from exposure to ambient environments, leading to degradation or reaction, as load lock chambers are unable to seal inert gas holders and unsealing in high vacuum compromises vacuum integrity.

Innovation Solution

A method involving a TEM sample holder that seals and unseals within a load lock using protecting gases like argon, helium, or xenon, controlling environmental conditions during transfer by coupling the holder to a load lock, providing vacuum, and filling it with protecting gas to maintain sample integrity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the holder capsule is unsealed in the high vacuum chamber to transfer the sample, then the sample can be transferred out of the TEM, but the vacuum integrity is compromised

Engineering Contradiction:
Improvesample transfer capabilityVSAvoidvacuum integrity
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

A load lock chamber is introduced as an intermediary space between the high vacuum chamber and the external environment. The holder capsule is sealed in the load lock under protecting gas atmosphere, then transferred to the vacuum chamber without breaking the vacuum seal. This mediator allows sample transfer while maintaining vacuum integrity in the main chamber.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the load lock chamber is used to transfer samples, then vacuum integrity is maintained, but the holder capsule cannot be sealed under protecting gas

Engineering Contradiction:
Improvevacuum integrityVSAvoidgas environment control
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The system is divided into functionally independent segments: the load lock chamber for vacuum maintenance and the holder capsule for protecting gas environment control. The holder capsule acts as a portable controlled environment that can be sealed under protecting gas in the load lock, then transported to the vacuum chamber. This segmentation allows each component to optimize its specific function.

Inventive Principle:
Principle #1Segmentation

3Ease of operation

If air-sensitive samples are exposed to ambient environments during transfer, then the transfer process is simplified, but the samples degrade or react

Engineering Contradiction:
Improvetransfer process simplicityVSAvoidsample degradation
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The holder capsule is filled with an inert protecting gas atmosphere (such as nitrogen or argon) that prevents chemical reactions with air-sensitive samples. The capsule is sealed under this protecting gas environment in the load lock, creating a protective barrier between the sample and ambient air during the entire transfer process, eliminating sample degradation.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables safe transfer of air-sensitive samples into and out of TEMs under controlled gas environments, preventing sample damage by managing pressure and composition gradients, thus preserving sample integrity.

Implementation Method 1

filling the load lock with a protecting gas

Methodology Applied
Scientific EffectGas pressure control: Pressure Increase

Implementation Method 2

providing a first vacuum in the load lock; providing a second vacuum in the load lock

Methodology Applied
Scientific EffectVacuum pressure differential: Pressure Gradient

Data Source

PatentEP4345862B1Systems and methods for transferring a sample into and out of a vacuum chamber of a transmission electron microscope
Publication Date: 2025.09.03 FEI CO
  • EP4345862B1 patent drawingFigure 1
  • EP4345862B1 patent drawingFigure 2
  • EP4345862B1 patent drawingFigure 3A

AI summary

Systems and methods for transferring a sample from a transmission electron microscope (TEM) column are described herein. In one aspect, a method can include transferring a sample positioned in a holder capsule of a TEM sample holder from a vacuum chamber of a TEM into a load lock of the TEM; filling the load lock with a protecting gas; sealing the holder capsule of the TEM sample holder under the protecting gas; and removing the TEM sample holder from the load lock.