Terahertz Testing Printed Metamaterial Conductivity
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Solution Overview
Problem
Existing methods for testing the conductivity of printed electronic devices are limited in resolution and can cause damage due to physical contact, necessitating a non-destructive and high-resolution testing method.
Innovation Solution
A terahertz radiation-based testing system that uses a metamaterial structure to emit and measure terahertz radiation, determining conductivity values without physical contact, and adjusts printing parameters accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If physical contact measurement probes are used to measure conductivity, then conductivity measurement can be performed, but the measurement resolution is limited and the printed electronic device may be damaged
Solution Approach 1:
The patent replaces the mechanical contact-based conductivity measurement system with a terahertz radiation-based non-contact measurement system. The terahertz radiation emitter and receiver measure conductivity by detecting changes in terahertz wave transmission through the conductive ink, eliminating the need for physical contact probes and thereby preventing device damage while achieving higher measurement precision
Solution Approach 2:
The patent changes the measurement parameter from direct electrical contact to terahertz wave transmission characteristics. By measuring the transmission amplitude and phase of terahertz waves through the conductive ink layer, the system achieves high-resolution conductivity measurement without mechanical contact, resolving the contradiction between measurement precision and device safety
2Ease of manufacture
If conventional printing techniques are used to deposit conductive ink, then electronic circuits can be printed on substrates, but the conductivity of the ink may vary below a given threshold affecting device operability
Solution Approach 1:
The patent implements a real-time feedback system where terahertz radiation measurement is performed during or after the printing process. The measured conductivity values are fed back to control the printing parameters (such as ink deposition amount, printing speed, or sintering conditions) to maintain conductivity within the required threshold, ensuring both ease of manufacture and reliability
Solution Approach 2:
The patent performs preliminary conductivity testing using terahertz radiation immediately after ink deposition but before final device assembly. This allows early detection and correction of conductivity variations, preventing defective devices from proceeding to subsequent manufacturing stages and ensuring consistent conductivity throughout production
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables non-destructive, high-resolution conductivity testing of printed electronic devices, improving production efficiency by identifying and correcting unsatisfactory devices in real-time.
Implementation Method 1
a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate
Implementation Method 2
the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure
Implementation Method 3
a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam
Implementation Method 4
a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude of the electric field of the outgoing terahertz radiation
Data Source
Figure 1
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Figure 3A~3B
AI summary
There is described an electronic device testing system for testing an electronic device having a substrate on which is printed a metamaterial structure using an ink. The electronic device testing system generally has: a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure; a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency; and a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude of the electric field of the outgoing terahertz radiation beam.