Test Board Isolation for Individual SoC Electrical Diagnostics
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Solution Overview
Problem
Existing burn-in boards struggle with increased test time and cost due to shared control and data lines among multiple DUTs, leading to slower test speeds and thermal stress on SoCs, while lacking accurate electrical measurement capabilities for individual SoCs.
Innovation Solution
A diagnostic system with a burn-in board configuration that includes a contact unit and measuring instrument to connect directly to each SoC pin, allowing for individual electrical quantity measurement and isolation, ensuring accurate diagnostics and high-speed testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple DUTs share control and data lines on the burn-in board, then the board can test multiple devices simultaneously, but the test speed decreases and thermal stress increases on the SoCs
Solution Approach 1:
The patent divides the shared control and data lines into dedicated lines for each DUT by introducing isolation switches. Each DUT has its own dedicated control lines and data lines that are isolated from other DUTs when not in use, allowing high-speed testing of individual DUTs without interference from other devices while maintaining the ability to test multiple DUTs simultaneously.
Solution Approach 2:
The patent introduces isolation switches as intermediary components between the shared bus lines and individual DUTs. These switches act as mediators that can connect or disconnect the shared control and data lines from specific DUTs, enabling the system to switch between testing different DUTs without thermal stress accumulation and maintaining high test speeds.
2Device complexity
If multiple DUTs share control and data lines, then the board structure is simplified, but accurate electrical measurement of individual SoCs becomes difficult
Solution Approach 1:
The patent segments the shared control and data lines into dedicated lines for each DUT using isolation switches. This segmentation allows the measuring instrument to connect to specific DUTs through dedicated lines, enabling accurate electrical measurements of individual SoCs without interference from other devices, while the overall board structure remains relatively simple.
Solution Approach 2:
The isolation switches serve as intermediary components that enable the measuring instrument to access specific DUTs through dedicated lines. This intermediary mechanism allows precise electrical measurements of individual SoCs by isolating them from the shared bus, while maintaining a simple board structure that doesn't require complete redesign.
3Measurement precision
If dedicated measuring instrument terminals are added for each SoC, then individual electrical measurements become possible, but the board complexity and cost increase
Solution Approach 1:
The patent makes the isolation switches multi-functional by enabling them to serve both as test control elements and as measurement isolation elements. The same isolation switches that control test signal routing also enable precise electrical measurements by providing dedicated paths to the measuring instrument, eliminating the need for separate dedicated measuring terminals for each SoC.
Solution Approach 2:
The isolation switches act as universal intermediaries that fulfill multiple functions: test control, signal routing, and measurement isolation. By using these existing intermediary components for measurement purposes, the patent enables individual SoC measurements without adding separate dedicated measuring instrument terminals, thus avoiding increased board complexity.
Data Source
AI summary
A test board, on which a test executable integrated circuit configured to execute a test of a device under test is mounted, includes a first input/output terminal, a second input/output terminal, and a contact unit. The first input/output terminal connects a first measuring apparatus capable of supplying electric power to the test board and controlling the test executable integrated circuit. The second input/output terminal connects a second measuring apparatus capable of measuring electrical characteristics of the test executable integrated circuit. The contact unit is mounted on the test board through the second input/output terminal and is capable of electrically connecting the second measuring apparatus.