Test Configuration Adapter for In-Place Functional and Supplemental Testing
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Solution Overview
Problem
Conventional electronic device testing systems are expensive, labor-intensive, and inefficient due to the need for separate systems for functional testing and supplemental operations, which require manual manipulation of devices under test, disrupting testing operations and increasing costs.
Innovation Solution
A test system configuration adapter that enables simultaneous communication between a device under test and both test equipment and supplemental equipment, allowing for flexible switching between functional testing and supplemental operations without physically moving the DUT, using a controller to manage the switching process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate dedicated systems are used for functional testing and supplemental operations, then each system can be optimized for its specific function, but the overall system complexity increases and requires multiple systems to be built and operated
Solution Approach 1:
The patent combines functional testing capabilities and supplemental operations capabilities into a single integrated test system. The test head includes both functional test circuits and supplemental operation circuits that can operate on the same DUT simultaneously or sequentially, eliminating the need for separate dedicated systems while maintaining the reliability benefits of specialized functionality.
Solution Approach 2:
The test system is designed with multi-functionality to perform both functional testing and supplemental operations through a single test head. The system can dynamically configure its circuitry to perform different types of testing and operations on the same DUT, providing universal capability that reduces overall system complexity while maintaining specialized functionality.
2Adaptability or versatility
If manual manipulation of DUTs is performed to move between separate test systems, then flexible testing procedures can be conducted, but labor intensity and operation time increase significantly
Solution Approach 1:
The integrated test system allows continuous testing operations without requiring manual removal and reinstallation of DUTs between different systems. The DUT remains in the same test head while the system dynamically reconfigures circuits to perform different testing functions, eliminating interruptions and manual manipulation while maintaining testing flexibility.
Solution Approach 2:
The test system employs dynamic reconfiguration of its internal circuits through switches and multiplexers that can change the connection topology based on the required testing function. This dynamic capability allows the system to adapt between different testing modes without physical manipulation of the DUT, combining flexibility with ease of operation.
3Adaptability or versatility
If DUTs are physically moved between separate test systems, then different testing procedures can be performed, but productivity decreases due to loading/unloading time and interruption of testing operations
Solution Approach 1:
By merging functional testing and supplemental operations into a single test head, the system eliminates the time required to physically move DUTs between separate systems. Multiple testing capabilities are available simultaneously through circuit switching, maintaining versatility while dramatically improving productivity by keeping the DUT in place throughout the entire testing sequence.
Solution Approach 2:
The system enables continuous testing operations where the DUT remains engaged with the test head throughout all testing procedures. The dynamic reconfiguration of circuits allows different testing functions to be performed sequentially or in parallel without interrupting the overall testing flow, thereby maximizing throughput while maintaining adaptability.
4Ease of manufacture
If conventional test systems are shut down to physically move DUTs, then equipment maintenance can be performed, but testing operations of all DUTs are interrupted and throughput is reduced
Solution Approach 1:
The test head is designed with dynamic, reconfigurable circuitry that allows different portions of the system to be accessed or maintained independently. The modular architecture with switchable circuits enables maintenance activities on specific circuit boards or components without requiring shutdown of the entire system or removal of DUTs from other test positions, thereby maintaining testing continuity while providing ease of manufacture and maintenance.
Data Source
AI summary
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The device under test side slot is configured to couple with the tester side socket, the break out pin, and a device under test, wherein the tester side socket. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the device under test remains coupled to the device under test side slot. In one exemplary implementation, the breakout pin and tester side socket are selectively coupled to the device under test side slot. The test system configuration adapter can include a switch configured to switch a portion of the coupling of the device under test side slot to the tester side socket and the break out pin.