Test Element Support With Embedded Thermal Insulation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing test element supports face challenges in achieving homogeneous temperature distribution over large active areas, leading to inefficient energy use and prolonged heating times, particularly in handheld devices, due to multiple heat paths and limited battery capacity.
Innovation Solution
A test element support with a substrate having an active area for heating and a non-active area separated by a thermal insulation element with lower conductivity, fully or partially embedded into the substrate, and a heater attached to the back face of the substrate to ensure efficient and uniform heating.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If a large heating area is used to heat the entire test element support, then the heating coverage is improved, but the energy consumption increases and heating time is prolonged
Solution Approach 1:
The heating area is segmented into an active heating area (first area) and a non-active area (second area) separated by a thermal insulation element. This segmentation allows the heater to concentrate thermal energy only on the active heating area where the test element is positioned, rather than heating the entire support structure. The thermal insulation element prevents heat diffusion to the non-active area, thereby reducing overall energy consumption while maintaining effective heating coverage.
Solution Approach 2:
The patent applies local quality by creating a localized heating zone with distinct thermal properties. The first area (active heating area) has high thermal conductivity to efficiently transfer heat from the heater to the test element, while the second area (non-active area) is thermally isolated through the insulation element. This local differentiation ensures that thermal energy is concentrated where needed, improving heating efficiency without increasing overall energy consumption.
2Area of stationary object
If a large heating area is used to heat the entire test element support, then the heating coverage is improved, but the heating time is prolonged
Solution Approach 1:
The heating area is segmented into an active heating area (first area) and a non-active area (second area) separated by a thermal insulation element. This segmentation allows the heater to concentrate thermal energy only on the active heating area where the test element is positioned, rather than heating the entire support structure. The thermal insulation element prevents heat diffusion to the non-active area, thereby reducing overall energy consumption while maintaining effective heating coverage.
Solution Approach 2:
The patent applies local quality by creating a localized heating zone with distinct thermal properties. The first area (active heating area) has high thermal conductivity to efficiently transfer heat from the heater to the test element, while the second area (non-active area) is thermally isolated through the insulation element. This local differentiation ensures that thermal energy is concentrated where needed, improving heating efficiency without increasing overall energy consumption.
3Use of energy by moving object
If thermal insulation elements are added to separate active and non-active areas, then energy efficiency is improved, but device complexity increases
Solution Approach 1:
The thermal insulation element is integrated directly into the test element support structure, merging the insulation function with the structural support function. The support structure comprises a substrate with the insulation element embedded within it, creating a unified component that provides both mechanical support and thermal isolation. This integration reduces the number of separate parts and simplifies assembly, thereby limiting the increase in device complexity.
Solution Approach 2:
The support structure serves multiple functions: it provides mechanical support for the heater and test element, and simultaneously acts as a thermal insulation barrier through the embedded insulation element. The substrate material is selected to provide both structural integrity and thermal management properties, allowing a single component to fulfill multiple roles and reducing overall device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design achieves homogeneous heating, reduces thermal energy requirements, and shortens the warm-up time, making it suitable for Point of Care instruments by focusing heat within the active area and minimizing heat transport to non-active regions.
Implementation Method 1
the active area and the non-active area being separated by at least one thermal insulation element, wherein the thermal insulation element has a lower thermal conductivity than the substrate material
Implementation Method 2
the test element support further comprises at least one heater, wherein the heater comprises at least one heater substrate
Data Source
AI summary
A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.