Test Handler Dual Circulation Paths Temperature Adaptation
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Solution Overview
Problem
Existing test handlers experience prolonged waiting times and reduced processing capacity due to the need to adjust temperature conditions for semiconductor devices, which requires significant time to change between high and low temperature tests.
Innovation Solution
A test handler system with dual circulation paths and temperature-controlled chambers allows for efficient temperature transitions, enabling the test tray to circulate through different temperature zones sequentially, reducing waiting time and enhancing processing capacity by allowing bypass sections and separate temperature adjustments for different test modes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the test handler uses a single circulation path with temperature adjustment chambers, then the semiconductor devices can be tested under different temperature conditions, but the waiting time increases significantly when changing between high and low temperature tests
Solution Approach 1:
The circulation path is divided into multiple independent paths (first circulation path for high temperature, second circulation path for low temperature). Each path has its own temperature-controlled chamber, allowing simultaneous preparation of different temperature conditions without interference, thus eliminating waiting time for temperature adjustments.
Solution Approach 2:
The system pre-prepares both high and low temperature conditions in parallel using separate circulation paths and chambers. When a temperature change is needed, the test tray can immediately switch to the pre-prepared path without waiting for temperature adjustment, as both conditions are maintained ready simultaneously.
2Reliability
If the test handler circulates the test tray through temperature adjustment chambers, then the semiconductor devices can be acclimated to test temperatures, but the processing capacity decreases due to extended cycle times
Solution Approach 1:
The system segments the temperature acclimation process into parallel independent paths. Multiple test trays can undergo temperature acclimation simultaneously in different chambers along different circulation paths, preventing sequential processing bottlenecks and maintaining high processing capacity while ensuring reliable temperature acclimation.
Solution Approach 2:
The dual circulation paths enable continuous temperature acclimation operations without interruption. While one path is acclimating devices to high temperature, the other simultaneously acclimates devices to low temperature, ensuring continuous productive operation without idle waiting periods.
3Device complexity
If the test handler uses a constant circulation path for all tests, then the system structure is simple, but it cannot efficiently handle both high and low temperature tests without position converters
Solution Approach 1:
The circulation system is segmented into multiple dedicated paths (first circulation path with first chamber for high temperature, second circulation path with second chamber for low temperature). This segmentation eliminates the need for complex position converters while enabling easy temperature mode switching through simple path selection, improving ease of operation without increasing overall structural complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach drastically reduces waiting time and increases the operating rate and processing capacity of the test handler by minimizing the time required for temperature adjustments between test modes.
Implementation Method 1
a first chamber for accommodating the test tray circulating along the first circulation path or the second circulation path by the plurality of transporters, the first chamber being provided to assimilate the semiconductor devices mounted on the test tray to a temperature corresponding to a first temperature condition according to the set first temperature condition; at least one or more first thermo-regulators for assimilating the inside of the first chamber to the first temperature condition
Implementation Method 2
a second chamber for accommodating the test tray circulating along the first circulation path or the second circulation path by the plurality of transporters, the second chamber being provided to assimilate the semiconductor devices mounted on the test tray to a temperature corresponding to a second temperature condition according to the set second temperature condition; at least one or more thermo-regulators for assimilating the inside of the second chamber to the second temperature condition
Implementation Method 3
a test chamber which is disposed between the first chamber and the second chamber on the first circulation path and the second circulation path, the test chamber being provided for supporting tests of the semiconductor devices mounted on the test tray accommodated therein; at least one or more third thermo-regulators for assimilating the inside of the test chamber to a temperature condition of test
Data Source
AI summary
In accordance with an embodiment of the present invention, there is provided a circulation method of a test tray in a test handler, the method comprising: in case of a first mode of test of temperature condition, firstly circulating the test tray along a first circulation path; and in case of a second mode of test of temperature condition different from the first mode, secondly circulating the test tray along a second circulation path, wherein the first circulation path and the second circulation path are different from each other in the transfer direction of the test tray at least in some sections.