Networked Test Management System for Machine Abnormality Diagnosis
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Solution Overview
Problem
In machine manufacturing factories, operators face challenges in determining the cause of abnormal test results due to a lack of experience and knowledge, leading to increased time and decreased productivity when dealing with multiple products across various test devices.
Innovation Solution
A machine test system that includes a network-connected test management device capable of performing basic and additional tests, automatically determining abnormalities and reallocating test tasks among devices to efficiently identify and address issues without relying on operator expertise.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If operators manually determine the cause of abnormal test results using their experience and knowledge, then diagnostic accuracy can be achieved, but the time required increases and productivity decreases
Solution Approach 1:
The test management device automatically performs the diagnostic function that previously required operator expertise. The system self-determines the cause of abnormalities by analyzing test results and selecting appropriate additional tests without human intervention, thereby maintaining diagnostic accuracy while eliminating time consumption associated with manual analysis
Solution Approach 2:
The patent replaces the mechanical cognitive process of human operators (experience-based judgment) with an automated information processing system. The test management device uses algorithms to analyze test data, determine abnormal causes, and sequence additional tests, substituting human mental operations with computational processes that are both accurate and rapid
2Reliability
If operators sequentially deal with multiple products having abnormal test results, then each product can be inspected thoroughly, but the total time required increases significantly
Solution Approach 1:
The test management device dynamically adjusts the inspection process based on real-time test results. When multiple products show abnormalities, the system automatically sequences additional tests across different products in an optimized order, allowing concurrent processing rather than strict sequential handling, thereby maintaining thoroughness while reducing total inspection time
Solution Approach 2:
The system performs preliminary analysis of test results to identify patterns and prioritize which products require immediate additional testing. By pre-determining the inspection sequence based on initial test data, the system avoids unnecessary delays and ensures that the most critical products are addressed first, maintaining reliability while minimizing time loss
3Device complexity
If the same test device performs both basic tests and additional tests, then device utilization is simplified, but the time required for abnormality determination increases
Solution Approach 1:
The patent segments the testing function into two distinct roles: basic test execution and additional test execution. The test management device assigns different test devices based on their availability and current workload, with some devices specializing in basic tests and others in additional tests. This segmentation allows parallel processing and reduces the time required for abnormality determination while maintaining manageable device complexity through automated assignment
Data Source
AI summary
A test system comprises a plurality of test devices which are connected to a plurality of machines and which perform a basic test, and a test management device which is connected to the plurality of test devices via a network. The test management device includes an additional test setting part which sets an additional test for determining a cause of an abnormality when determining that the machine has the abnormality. The test management device includes an adjustment part which sets the test device that performs the additional test. The adjustment part determines that the basic test planned to be performed by the test device that performs the additional test is performed by the other test device.