TFT Array Substrate Redundant Scan Line Opening Ratio
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Solution Overview
Problem
The existing TFT array substrates in display panels have a low opening ratio due to the conventional design of scan and data lines, which affects the efficiency and reliability of the display panels.
Innovation Solution
The proposed solution involves a TFT array substrate design with a redundancy or dummy scan line that acts as a repair line, allowing for improved opening ratio by reducing the number of scan lines required to control multiple pixels, and a manufacturing method that includes specific layer formations and electrode configurations for TFTs, such as bottom gate and top gate types, to enhance the substrate's performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional scan lines and data lines are used to control pixels, then the display panel can function properly, but the opening ratio of the TFT array substrate is reduced
Solution Approach 1:
The scan lines are segmented into multiple groups, where each group controls a specific region of pixels. This allows for independent control and repair of different regions, enabling the removal of redundant scan lines and improving the opening ratio while maintaining display functionality through the dummy scan line mechanism.
Solution Approach 2:
The dummy scan line serves multiple functions: it acts as a repair line for defective pixels, maintains the structural integrity of the TFT array, and enables the reduction of functional scan lines to improve opening ratio. This multi-functionality resolves the contradiction between reliability and opening ratio.
2Reliability
If more scan lines are used to ensure complete pixel control, then pixel coverage is improved, but the quantity of scan lines increases reducing efficiency
Solution Approach 1:
Instead of providing exactly one scan line per pixel row, the patent uses fewer functional scan lines combined with dummy scan lines. The dummy scan lines provide the necessary redundancy for repair purposes, allowing the system to achieve complete pixel control with fewer active scan lines, thus improving efficiency.
3Area of stationary object
If the number of scan lines is reduced to improve opening ratio, then manufacturing efficiency improves, but the ability to control all pixels may be compromised
Solution Approach 1:
Dummy scan lines are pre-configured in the TFT array structure during manufacturing to serve as repair lines. This preliminary action ensures that even with reduced functional scan lines, all pixels can be controlled and defective pixels can be repaired, maintaining reliability while improving opening ratio.
Data Source
AI summary
A TFT array substrate includes a plurality of scan lines, a plurality of date lines, a plurality of pixels, a first TFT, and a second TFT. The number of scan lines includes a first scan line. The date lines are insulated with the scan lines include a first date line and a second date line. The first date line is insulated and at least partly covering the second date line. The pixels are defined by two adjacent scan lines and two adjacent date lines. The first TFT is configured to drive a first pixel at the first side of the first scan line and being coupled with the first scan line and the first date line. The second TFT is configured to drive a second pixel at the second side of the first scan line and being coupled with the first scan line and the second date line.