TFT Array Substrate Repair Line Structure for Broken Data Lines

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Solution Overview

Problem

TFT array substrates in LCDs are prone to data line damage during handling, transportation, or cleaning, leading to broken gaps that impair image display in corresponding pixel regions.

Innovation Solution

A method for fabricating a TFT array substrate that includes a repair line structure, where a repair line with gaps is integrated into the substrate, allowing for the repair of broken data lines by overlapping with gate and common lines, enabling electrical connection and restoration of data signal transfer without interfering with existing lines.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a repair line structure is added to the TFT array substrate, then the reliability and ease of repair are improved, but the device complexity increases

Engineering Contradiction:
ImprovereliabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The repair line structure is pre-formed during the initial fabrication process using the same photolithography steps as the common electrode and gate line. This preliminary action ensures that repair capabilities are built into the substrate before any potential damage occurs, allowing future repairs without adding complexity to the final device structure.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The repair line structure serves multiple functions: it acts as a common electrode in non-defect areas and provides repair pathways for damaged data lines in defective areas. This multi-functionality improves reliability without requiring separate dedicated repair structures, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of repair

If a repair line structure is integrated into the TFT array substrate, then the ease of repair is improved, but the manufacturing precision requirements increase

Engineering Contradiction:
Improveease of repairVSAvoidmanufacturing precision
Core Design Contradiction:
Ease of repairVSManufacturing precision

Solution Approach 1:

The repair line structure is merged with the common electrode and gate line formation processes. By using the same photolithography masks and deposition steps, the repair structure inherits the manufacturing precision of these existing components without requiring separate high-precision alignment steps, thus improving ease of repair while limiting the increase in manufacturing precision requirements.

Inventive Principle:
Principle #5Merging (Combining)

3Manufacturing precision

If additional photolithography processes are used for repair line fabrication, then the manufacturing precision is improved, but the productivity decreases

Engineering Contradiction:
Improvemanufacturing precisionVSAvoidproductivity
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The formation of the repair line structure is merged with the existing photolithography processes for creating the common electrode and gate line. This consolidation allows the repair structure to be fabricated using the same masks and deposition steps already required for these components, thereby achieving necessary manufacturing precision without adding extra photolithography cycles and maintaining productivity.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS7901951B2Thin film transistor array substrate and method for fabricating same
Publication Date: 2011.03.08 RED OAK INNOVATIONS LTD
  • US7901951B2 patent drawing
  • US7901951B2 patent drawing
  • US7901951B2 patent drawing

AI summary

An exemplary TFT array substrate includes: an insulating substrate (201), a gate line (23) and a repair structure (272) arranged on the insulating substrate, a gate insulating layer (204) covering the gate line and the repair structure; a data line (27) arranged on the gate insulating layer corresponding to the repair structure, which is insulated from the gate line and intersects with the gate line. The repair structure has a gap (274). The gap of the repair structure is located at where the repair structure overlapping to the gate line.