Thermal Radiation Pattern Generator for Deflectometry
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Solution Overview
Problem
Classic deflectometric methods fail to effectively inspect non-directional or diffusely reflecting surfaces, such as unpainted sheet metal, due to low specular reflection, and existing solutions struggle with generating variable and dynamic thermal radiation patterns in the thermal spectral range.
Innovation Solution
A device and method utilizing a sharply focused radiation source, like a laser, to generate variable and dynamic patterns in the visible or near-infrared range, which are then converted into thermal radiation patterns for non-directional emission, enabling efficient inspection of rough surfaces with freely selectable and quickly changeable patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If classic deflectometric methods are used to inspect diffusely reflecting surfaces, then the inspection can be performed with simple equipment, but the specular reflection proportion is too small to achieve effective detection
Solution Approach 1:
The patent changes the wavelength parameter of the radiation from visible/near-infrared to thermal infrared range (>1.2 μm). This parameter change exploits the physical property that rough surfaces have increased specular reflection in the thermal infrared range, thereby improving detection effectiveness while maintaining equipment simplicity
Solution Approach 2:
The patent creates a thermal radiation pattern that copies the desired stripe pattern onto a screen, which then emits thermal radiation. This copying approach allows the use of simple display technology to generate complex thermal patterns that would be difficult to produce directly
2Reliability
If thermal radiation patterns are generated for deflectometric inspection of rough surfaces, then the specular reflection proportion increases, but the generation of variable and dynamic patterns becomes practically difficult
Solution Approach 1:
The patent replaces mechanical pattern generation systems with an optoelectronic approach. A display device generates the pattern electronically, and a radiation source converts it to thermal radiation. This substitution enables dynamic and variable patterns without complex mechanical adjustments
Solution Approach 2:
The patent introduces a screen as an intermediary between the pattern generator and the radiation source. The screen receives the desired pattern and converts it to thermal radiation, mediating between the electronic control system and the thermal inspection process
3Productivity
If a sharply focused radiation source is used to generate variable patterns, then the pattern generation becomes efficient and low-complexity, but the conversion to thermal radiation patterns is required
Solution Approach 1:
The patent uses a radiation source that can change its emission spectrum based on the required pattern. By adjusting the spectral parameters of the radiation source, it can efficiently generate patterns in different spectral ranges, including thermal infrared, while maintaining high productivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables unrestricted industrial use of deflectometric concepts for inspecting surfaces that only reflect specularly in the thermal infrared, with efficient and low-complexity pattern generation, suitable for surfaces like unpainted sheet metal, without requiring mechanical adjustments or specific evaluation methods.
Implementation Method 1
A device and method utilizing a sharply focused radiation source, like a laser, to generate variable and dynamic patterns in the visible or near-infrared range, which are then converted into thermal radiation patterns for non-directional emission
Implementation Method 2
A device and method utilizing a sharply focused radiation source, like a laser, to generate variable and dynamic patterns
Implementation Method 3
Based on the specular (directed) reflection of the pattern on the test object surface according to the law of reflection, conclusions can be drawn about the surface from the observation
Data Source
Figure 1
Figure 2a~2b
Figure 3
AI summary
The device has radiation sources (302) e.g. laser, for producing variable patterns (104), and a converting device (306) for converting the variable patterns in a thermal spectral region for scattered radiation of the variable patterns as a thermal radiation pattern (108). The converting device has a radiation absorbing screen with a pattern producing region. The screen is moved such that a pattern is attached on another pattern producing region different from the former pattern producing region after attaching another pattern on the former pattern producing region of the screen. Independent claims are also included for the following: (1) a device for deflectometric investigation of a surface (2) a method for generating a spatially and/or time-variable thermal radiation pattern (3) a computer program for executing a method for generating a spatially and/or time-variable thermal radiation pattern.