Thermal Shock Testing With Pre-Cooled Chamber and Lamp Heating
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Solution Overview
Problem
Existing thermal shock testing methods struggle to achieve rapid and efficient temperature transitions in environmental testing apparatus, particularly for semiconductor devices with high temperature requirements, leading to prolonged evaluation times.
Innovation Solution
A thermal shock testing apparatus utilizing a chiller to cool and a lamp heater to heat the test sample within a sealed test chamber, controlled by a temperature sensor and control device, enabling rapid temperature changes between high and low temperatures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If local heating devices such as far infrared lamps or local cooling devices such as spot type chillers are used in the environmental testing apparatus, then local heating or cooling can be conducted while carrying out a temperature-humidity test, but the inside of the chamber is not held at a low temperature or high temperature in advance, making it difficult to achieve heating or cooling in a short time
Solution Approach 1:
The chamber is pre-cooled to a low temperature before the thermal shock test begins. This preliminary cooling action ensures that when the heater is activated, the temperature transition to high temperature can occur rapidly without the delay of first cooling the chamber, thus resolving the time loss issue while maintaining the capability for local heating
2Speed
If the test sample is heated from ambient temperature to high temperature, then the heating process takes a long time, but if the test chamber is pre-cooled and the sample is heated from low temperature, then rapid temperature transition can be achieved
Solution Approach 1:
The chiller and heater operate in a continuous, coordinated manner. The chiller continuously maintains the chamber at low temperature, and the heater is activated continuously when needed to transition the sample to high temperature. This continuous operation without interruption or idle time enables rapid temperature transitions while managing system complexity through streamlined control
3Reliability
If conventional thermal shock testing methods are used with prolonged evaluation periods, then reliable evaluation can be achieved, but the evaluation time becomes excessively long affecting development efficiency
Solution Approach 1:
The patent changes the temperature parameters dynamically by pre-cooling the chamber to low temperature and then rapidly heating to high temperature. This parameter change strategy enables the thermal shock test to achieve reliable evaluation results in a much shorter time period, thereby improving productivity without compromising reliability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable thermal shock evaluation in a short time by quickly applying temperature differences, reducing evaluation time for semiconductor devices.
Implementation Method 1
a chiller which circulates coolant inside the test chamber, and cools inside of the test chamber
Implementation Method 2
a heater which is installed inside of the test chamber, and heats the test sample
Implementation Method 3
a temperature sensor which detects a temperature of the test sample
Data Source
AI summary
A thermal shock testing apparatus includes a test chamber in which a test sample is placed, and which is sealed; a chiller which cools the test chamber to a predetermined temperature with coolant; a lamp heater which heats the test sample to a target temperature; a temperature sensor which detects a temperature of the test sample; a control device which controls the operation of the chiller, and the energization and shut-off of the lamp heater. The test sample is heated to a target temperature with the lamp heater, after the test chamber is cooled to a predetermined temperature. Thereafter, the energization of the lamp heater is shut off, and a thermal shock is added to the test sample. Thereby, a thermal shock test can be conducted in a short time.