Thiol-ene Resist Composition for High Refractive Index Nanoimprint Lithography

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Solution Overview

Problem

Current nanoimprint lithography (NIL) inks have limitations in achieving high refractive indices (n>1.65) and are not suitable for roll-to-roll processes, with existing materials requiring postannealing steps and being unsuitable for high-resolution patterning of optical devices.

Innovation Solution

A composition comprising a thiol, -ene monomers, a polymerization initiator, and optionally metal oxides, such as TiO2, is used to create a high-refractive-index polymer matrix that can be cured at room temperature without postannealing, achieving refractive indices up to 1.8 and high transparency for nanoimprint processes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If conventional NIL inks are used, then the patterning process can be performed, but the refractive index remains limited (n<1.65) and postannealing is required

Engineering Contradiction:
Improvecuring temperatureVSAvoidrefractive index
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

The patent changes the chemical parameters of the resist material by using thiol-ene monomers with specific refractive indices (1.6-1.8) in stoichiometric ratios, combined with metal oxide nanoparticles (0.1-50 wt%), to achieve room temperature curing while maintaining high refractive index (n>1.65) without requiring postannealing treatment

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite resist material combining organic thiol-ene monomers with inorganic metal oxide nanoparticles (TiO2, ZnO, etc.), where the inorganic component provides high refractive index and the organic component enables room temperature photopolymerization, achieving both high optical performance and simplified processing

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If high refractive index materials are used, then optical performance improves, but the materials require postannealing steps that complicate the process

Engineering Contradiction:
Improverefractive indexVSAvoidprocess steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent extracts the postannealing step from the conventional NIL process by designing a resist composition that achieves complete curing through room temperature photopolymerization alone, eliminating the need for subsequent thermal annealing treatment while maintaining high refractive index (n>1.65)

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the chemical composition parameters to include thiol-ene monomers with specific refractive indices (1.6-1.8) and metal oxide content (0.1-50 wt%), enabling the material to achieve high optical performance and complete crosslinking at room temperature without requiring postannealing

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If traditional resist materials are used, then patterning can be achieved, but high-resolution patterning for optical devices is not suitable

Engineering Contradiction:
Improvepattern resolutionVSAvoidoptical device fabrication
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent optimizes the resist composition parameters including thiol-ene monomer selection (with refractive index 1.6-1.8), stoichiometric ratio (1:1 to 1:4), and metal oxide nanoparticle content (0.1-50 wt%), achieving both high pattern resolution for optical devices and ease of manufacture through room temperature processing

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition enables the fabrication of nanostructured films with refractive indices greater than 1.65 and high transparency (>90%) without the need for postannealing, suitable for roll-to-roll processes and high-resolution patterning of optical devices.

Implementation Method 1

cured by thermal or radiation energy, e.g., by UV radiation at room temperature with light having a wavelength ranging from 244 nm to 400 nm

Methodology Applied
Scientific EffectPhotopolymerization: Photopolymerisation

Implementation Method 2

at least one metal oxide used in an amount ranging from 0.1 to 50 wt. % per weight of the composition; the thiol and the -ene monomer with a refractive index in the range of 1.6 to 1.8

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS20160109799A1Composition for resist patterning and method of manufacturing optical structures using imprint lithography
Publication Date: 2016.04.21 ABEAM TECH
  • US20160109799A1 patent drawing
  • US20160109799A1 patent drawing

AI summary

Provided is a composition for resist patterning comprising a thiol; at least one -ene monomer; at least one polymerization initiator; and, optionally, a metal oxide used in an amount of 0.1 to 50 wt. % per weight of the composition; the thiol and -ene monomer are used in a stoichiometric ratio with a refractive index between 1.6 and 1.8. The composition is used in a patterning process wherein the composition is dispensed to the substrate, is covered with a mask, and is cured, e.g., by UV radiation, at room temperature with light having a wavelength in the range of 200 nm to 450 nm. The process may be carried out with thermal annealing.