THz Measuring Device With Static Mirrors for Extrusion Inspection
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Solution Overview
Problem
Existing THz measuring devices for extruded materials face challenges with rotating components that incur high wear, inaccuracies, and space restrictions, particularly in high-temperature environments, limiting accurate and efficient measurement of properties like layer thickness and refraction index.
Innovation Solution
A THz measuring device with static mirror arrays and transceivers arranged around a longitudinal axis, emitting and detecting THz radiation through extruded objects without rotating parts, allowing for precise measurements by comparing calibration and object measurements to determine layer thickness and refraction index.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If rotating components are used in THz measuring devices, then measurement capability is achieved, but wear and inaccuracies increase
Solution Approach 1:
The patent replaces rotating mechanical mirror components with a static mirror array arrangement. Multiple fixed mirrors are positioned at specific angles to achieve the same beam deflection function that would otherwise require a rotating mirror, thereby eliminating mechanical wear and improving measurement reliability.
Solution Approach 2:
The measuring device is divided into multiple independent static mirror elements arranged in an array configuration. Each mirror performs a specific function in the beam path, and collectively they replace the function of a single rotating mirror component, enabling measurement without mechanical movement.
2Measurement precision
If rotating components are used in THz measuring devices, then measurement is possible, but space restrictions increase
Solution Approach 1:
The patent transitions from a single rotating mirror requiring radial space to a static mirror array distributed in a two-dimensional plane. The mirrors are arranged at specific positions and angles in the x-y plane, utilizing spatial distribution to achieve the same measurement function with reduced overall device footprint.
3Measurement precision
If rotating components are used in high-temperature environments, then measurement can be performed, but temperature-related inaccuracies increase
Solution Approach 1:
The patent eliminates rotating mechanical components that are sensitive to thermal expansion and lubrication degradation at high temperatures. The static mirror array maintains stable optical paths even in elevated temperature environments, as there are no moving parts subject to thermal stress and wear.
4Reliability
If static mirror arrays are used instead of rotating components, then wear is reduced, but device complexity increases
Solution Approach 1:
While the device is segmented into multiple mirror elements, this segmentation enables a static configuration that improves reliability. The complexity is managed through systematic arrangement of the mirror array, where each element has a defined position and angle, replacing the complexity of mechanical control systems with fixed geometric relationships.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides secure, durable, and accurate measurements of extruded materials with reduced wear and cost, enabling real-time regulation of extrusion parameters and detection of inclusions and irregularities without rotating components.
Implementation Method 1
The THz radiation may lie, in particular, within the frequency range between 10 Gigahertz (GHz) and 50 THz, in particular 10 GHz and 10 THz, in particular 20 GHz and 3 THz, preferably 50 GHz and 1 THz.
Implementation Method 2
The THz radiation may be emitted and detected, in particular, as direct time-of-flight measurement and/or using frequency modulation and/or as pulsed radiation.
Implementation Method 3
determine a property of the measuring object (2) from the measurement signals of the THz transceivers (5a, 5b, 5c, 5d), the property of the measuring object (2) being one or more elements of the group consisting of: a layer thickness (d) of the measuring object (2), a refraction index (n2) of the measuring object (2)
Implementation Method 4
the transmitted beam is reflected at a first deflection mirror (8a, 8b, 8c, 8d) and runs along the longitudinal axis (A) as a lengthwise running transmitted beam (17a, 17b, 17c, 17d) and is subsequently reflected at a second deflection mirror (18a, 18b, 18c, 18d) in a direction radially outwards
Data Source
AI summary
The present disclosure relates to a THz measuring device for measuring an extruded measuring object.