N-UI Jitter Separation via TIE Spectrum Analysis
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Solution Overview
Problem
Current test and measurement instruments face challenges in accurately separating and measuring N-UI-based jitter components, such as random jitter, deterministic jitter, and total jitter, due to differences in jitter measurement metrics and the computational intensity required for N-UI spectrum generation.
Innovation Solution
A spectrum analysis-based approach that utilizes a time interval error (TIE) spectrum to identify deterministic jitter frequency bins, allowing for direct computation of the N-UI spectrum without additional Fourier transforms, thereby enhancing measurement accuracy and efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional Fourier transform methods are used to generate N-UI spectrum, then measurement accuracy is maintained, but computational time and resources increase significantly
Solution Approach 1:
The patent performs a single Fourier transform on the TIE signal to obtain the TIE spectrum beforehand, then reuses this spectrum information multiple times to determine different N-UI jitter components. This preliminary action eliminates the need for repeated Fourier transforms, significantly reducing computational time while maintaining measurement accuracy.
Solution Approach 2:
The patent creates a copy of the TIE spectrum information and uses it to derive N-UI spectrum characteristics without performing additional transforms. By copying and reusing the spectral information, the method avoids redundant computational operations while preserving the accuracy required for jitter component separation.
2Measurement precision
If multiple Fourier transforms are performed to separate jitter components, then measurement precision is improved, but device complexity and computational resources increase
Solution Approach 1:
The patent performs the computationally intensive Fourier transform operation once to obtain the TIE spectrum, then uses this pre-computed spectrum to determine multiple N-UI jitter components through simpler mathematical operations. This preliminary action significantly reduces the overall computational complexity while maintaining the ability to separate different jitter components accurately.
Solution Approach 2:
The TIE spectrum serves multiple functions in the patent: it is used to determine random jitter, deterministic jitter, and total jitter components for different N values. By making the TIE spectrum a universal reference that can be reused for multiple measurement purposes, the patent reduces the need for separate Fourier transforms for each jitter component.
3Measurement precision
If N-UI spectrum is generated through additional Fourier transforms, then measurement accuracy is maintained, but productivity decreases due to extended test time
Solution Approach 1:
The patent performs the Fourier transform operation in advance to obtain the TIE spectrum, then uses this pre-computed information to rapidly determine N-UI jitter components. This preliminary action eliminates the need for time-consuming additional transforms, significantly improving test efficiency while maintaining measurement accuracy.
Solution Approach 2:
The patent copies the TIE spectrum information and uses it to derive N-UI spectrum characteristics through simpler operations. This copying approach avoids the computational overhead of additional Fourier transforms, thereby improving productivity without sacrificing the accuracy required for precise N-UI jitter measurement.
Data Source
AI summary
A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.