Tiled Display Back Wiring Layout With UV Selective Reflective Film
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Solution Overview
Problem
Existing display devices face challenges in minimizing the non-display area by preventing bottom wirings from being recognized during inspection processes, as plasma patterning can alter the characteristics of thin film transistors, leading to visibility issues in the inspection of pixels.
Innovation Solution
A display device design incorporating a substrate with transistors, light emitting elements, and bottom wirings, featuring selective reflective films with alternating layers of different refractive indices to reflect short-wavelength light, thereby preventing its incidence on transistors and reducing the visibility of bottom wirings and device identifiers in inspection images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If bottom wirings are disposed on the rear surface of the display device, then the non-display area is reduced, but the bottom wirings become visible during inspection process due to plasma patterning effects
Solution Approach 1:
A selective reflective film is introduced as an intermediary layer between the bottom wirings and the inspection light. This film selectively reflects short-wavelength light (310 nm or less) to prevent it from reaching the bottom wirings and transistors, while allowing other wavelengths to pass through for normal display operation. This resolves the contradiction by blocking the harmful inspection light without affecting the display area.
Solution Approach 2:
The selective reflective film changes the optical parameters by wavelength, reflecting short-wavelength light (310 nm or less) while transmitting other wavelengths. This wavelength-selective parameter change allows the bottom wirings to remain visible for display purposes while preventing their visibility during inspection processes using short-wavelength light.
2Ease of manufacture
If plasma patterning is used to pattern bottom wirings, then the bottom wirings can be formed, but the characteristics of thin film transistors are changed
Solution Approach 1:
The harmful effect of plasma on transistors is extracted and isolated by introducing the selective reflective film. This film prevents plasma-generated short-wavelength light from reaching the transistors during the bottom wiring patterning process, allowing plasma patterning to proceed without damaging the transistor characteristics.
3Measurement precision
If inspection light with short wavelength is used to inspect transistors, then the inspection process can be performed, but bottom wirings and device identifiers become visible in the inspection images
Solution Approach 1:
The selective reflective film converts the harmful short-wavelength inspection light into a beneficial tool by reflecting it away from the bottom wirings and device identifiers. This prevents these components from appearing in inspection images, thereby improving image quality while maintaining the effectiveness of short-wavelength inspection light for transistor inspection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively minimizes the visibility of bottom wirings and device identifiers in inspection images by reducing the positive shift in transistor threshold voltages, enhancing the inspection process and reducing the visibility of these components.
Implementation Method 1
a first selective reflective film between the substrate and the plurality of bottom wirings. The first selective reflective film includes M pairs of first layers and second layers... A refractive index of the first layer is higher than a refractive index of the second layer. A reflective target wavelength of the first selective reflective film may be 310 nm or less.
Implementation Method 2
The first selective reflective film includes M pairs of first layers and second layers, where M is an integer greater than or equal to 2... A difference between a refractive index of the first layer and a refractive index of the second layer may be 0.55 or more.
Data Source
AI summary
A tiled display device includes a display device. The display device including a substrate, a plurality of transistors on one surface of the substrate, a plurality of light emitting elements on the plurality of transistors, a plurality of bottom wirings on a rear surface of the substrate, and a first selective reflective film between the substrate and the plurality of bottom wirings. The first selective reflective film includes M pairs of first layers and second layers, where M is an integer greater than or equal to 2. A refractive index of the first layer is higher than a refractive index of the second layer.