Time Domain Multiplexed Defect Scanner for Glass
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Solution Overview
Problem
Current techniques face challenges in inspecting glass samples due to their low reflectivity and high transparency, particularly in detecting defects in fragile, asymmetric, or large samples, which are essential for high technology products like televisions and mobile devices.
Innovation Solution
An optical scanning system utilizing a first and second radiating source with different wavelengths, a time-varying beam reflector, and a compound ellipsoidal collector to direct light scattered from the sample towards a detector, allowing for defect detection by determining changes in scattered radiation patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If glass samples are spun for inspection, then defects can be detected, but fragile, asymmetric, or large samples cannot be tested
Solution Approach 1:
Instead of rotating the glass sample to enable defect detection, the patent inverts the approach by keeping the sample stationary and rotating the light source and detector assembly. This allows detection of defects in fragile, asymmetric, or large samples that cannot be spun, while maintaining the same defect detection capability through the reversed rotation mechanism.
2Measurement precision
If multiple light sources with different wavelengths are used, then sensitivity is improved, but device complexity increases
Solution Approach 1:
The patent combines multiple light sources with different wavelengths into a single optical system that shares common optical paths, including the scan lens, beam reflector, and detector. This merging approach improves defect detection sensitivity through multi-wavelength illumination while minimizing device complexity by avoiding duplicate optical components for each wavelength.
Solution Approach 2:
The optical system is designed with multi-functionality where a single scan lens, beam reflector, and detector assembly serve multiple wavelengths simultaneously. This universal design allows the same components to handle different light sources, improving sensitivity across multiple wavelengths without proportionally increasing device complexity.
3Measurement precision
If light is directed at Brewster's angle, then sensitivity for transparent samples is improved, but signal separation becomes more challenging
Solution Approach 1:
The patent introduces a beam reflector as an intermediary component that directs light at Brewster's angle for enhanced sensitivity while simultaneously managing the separation of reflected and transmitted signals. The beam reflector acts as a mediator that maintains the advantageous Brewster's angle illumination for transparent samples while organizing the optical paths to facilitate signal separation through controlled reflection geometry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of defects on glass samples by separating signals from the top and bottom surfaces, accommodating various shapes and sizes, and improving sensitivity by irradiating at or near Brewster's angle, thus enhancing the inspection process for transparent samples.
Implementation Method 1
a first radiating source capable of outputting a first source light beam and a second radiating source capable of outputting a second source light beam
Implementation Method 2
a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample
Implementation Method 3
irradiating at or near Brewster's angle, thus enhancing the inspection process for transparent samples
Implementation Method 4
a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample
Implementation Method 5
a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector
Implementation Method 6
a scattered radiation detector... determining changes in scattered radiation patterns
Data Source
AI summary
An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.