Timed Autonomous Electronic Device Testing With Result Logging
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Solution Overview
Problem
Existing methods for testing electronic devices are inefficient and can be disrupted by user activity or device status, affecting test accuracy and user experience.
Innovation Solution
A device testing system and method where a server transmits test data including a test time and instruction to an electronic device, which autonomously sets and executes the test event based on the time and conditions, recording results without manual intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual testing methods are used, then testing can be performed, but testing efficiency is low and user interference occurs
Solution Approach 1:
The device under test autonomously executes testing operations based on received test data and system time, without requiring manual intervention. The processing unit automatically determines whether to execute test instructions by comparing current system time with test time in the test data, and autonomously controls the unit under test and records test results,实现 self-service testing
Solution Approach 2:
Test data including test instructions and test time is transmitted to the device in advance before the actual testing moment. The device stores this preliminary test data and waits for the system time to match the test time, enabling preparedness and automated execution without last-minute manual intervention
2Productivity
If automated testing is implemented, then testing efficiency improves, but device complexity increases
Solution Approach 1:
The processing unit performs multiple functions: it processes test data, compares system time with test time, determines execution decisions, controls the unit under test, and records test results. This multi-functionality reduces the need for separate dedicated components, thereby automating testing without proportionally increasing device complexity
Solution Approach 2:
The testing functionality is merged into the existing device architecture, utilizing the processing unit and memory unit that already exist in the device. Test data is stored in the device's memory and execution logic is integrated into the processing unit, combining testing functions with existing device components rather than adding separate testing hardware
Data Source
AI summary
A device testing method, including: transmitting, by a server, test data to a device under test, wherein the test data includes a test time and a test instruction, and the test instruction corresponds to a unit under test in the device under test; determining, by the device under test, whether a system time of the device under test corresponds to the test time; and when the system time corresponds to the test time, controlling the unit under test according to the test instruction and recording a test result of the unit under test executing the test instruction.