Tin Alloy Electroplating for Whisker-Free Deposits

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Solution Overview

Problem

Lead-free tin or tin alloy solders deposited using electrochemical techniques tend to grow whiskers, causing short-circuiting and poor reliability in electronics due to internal stresses, grain size, and organic additives, which are difficult to control and maintain.

Innovation Solution

An electrochemical plating process that controls metal deposit properties by manipulating electrodynamics to prevent whisker growth, achieving a matte finish, controlled grain size, and manageable internal stresses without using organic additives, using an electrically mediated waveform with specific current and time parameters.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If organic additives are added to the plating bath to control grain size and current distribution, then the desired grain size (1 to 8 micrometers) is achieved, but the additives break down, become incorporated into the deposit, promote whisker growth, and degrade long-term solder performance

Engineering Contradiction:
Improvegrain size controlVSAvoidwhisker growth prevention
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The invention removes organic additives from the plating bath entirely, extracting the harmful element that causes whisker growth while maintaining grain size control through alternative means (plating parameters and bath composition without organics).

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention changes the plating parameters (current density, temperature, bath composition) to achieve grain size control without relying on organic additives, fundamentally altering how grain structure is controlled in the deposition process.

Inventive Principle:
Principle #35Parameter changes

2Illumination intensity

If plating bath additives are used to make the plating deposit bright and shiny, then a bright finish is achieved, but internal stress increases and whisker growth is promoted

Engineering Contradiction:
Improvesurface brightnessVSAvoidinternal stress
Core Design Contradiction:
Illumination intensityVSStress or pressure

Solution Approach 1:

The invention accepts a matte finish (apparently less desirable) as it eliminates internal stress and whisker growth, converting what seems like a cosmetic disadvantage into a reliability advantage by removing the need for stress-promoting brightening additives.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Productivity

If direct current plating is used, then the plating process is simple and fast, but the deposits are highly stressed and prone to whisker growth

Engineering Contradiction:
Improveplating speedVSAvoidinternal stress
Core Design Contradiction:
ProductivityVSStress or pressure

Solution Approach 1:

The invention employs pulse plating with periodic reversal (pulse reverse plating) where current is applied in alternating forward and reverse directions, creating periodic deposition and dissolution cycles that reduce internal stress while maintaining reasonable deposition rates.

Inventive Principle:
Principle #19Periodic action

4Object-affected harmful factors

If lead-free tin or tin alloy solders are deposited using electrochemical techniques, then environmental requirements are met, but the deposits tend to grow whiskers causing short-circuiting and poor reliability

Engineering Contradiction:
Improveenvironmental safetyVSAvoidwhisker growth prevention
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

The invention removes organic additives from the plating process, extracting the root cause of whisker growth while maintaining lead-free composition, thereby achieving both environmental safety and reliability.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention changes the electrochemical parameters (pulse reverse plating, current density, temperature) to produce low-stress deposits that resist whisker growth, fundamentally altering the deposition mechanism to improve reliability.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The process results in whisker-free tin or tin alloy deposits with consistent grain sizes and stress profiles, enhancing the reliability and longevity of electronic components by eliminating whisker growth and maintaining a stable surface finish.

Implementation Method 1

A method and apparatus for deposition of tin or tin alloy on a workpiece such as a semiconductor wafer, wafer level package, chip scale package or printed circuit board

Methodology Applied
Scientific EffectElectrochemical deposition: Electrodeposition

Data Source

PatentUS8603315B2Tin and tin alloy electroplating method with controlled internal stress and grain size of the resulting deposit
Publication Date: 2013.12.10 FARADAY TECHNOLOGY INC
  • US8603315B2 patent drawing
  • US8603315B2 patent drawing
  • US8603315B2 patent drawing

AI summary

A method for electrochemically plating tin or tin alloy onto a workpiece to provide a tin or tin alloy deposit on said workpiece having a stress differential and workpieces characterized by a tin or tin alloy deposit having a stress differential.