Tin Compound Precursors Balancing Thermal Stability and Vapor Pressure

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing precursors for atomic layer deposition (ALD) methods lack high thermal stability and high vapor pressure, limiting the ability to form high-quality thin-films containing tin atoms.

Innovation Solution

A tin compound with a specific noble structure, represented by general formula (1), is used as a precursor, offering excellent thermal stability and high vapor pressure, enabling the production of high-quality thin-films containing tin atoms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional precursors are used for ALD method, then the film formation process can proceed, but the thermal stability is insufficient and vapor pressure is low, resulting in poor film quality

Engineering Contradiction:
Improvethermal stabilityVSAvoidvapor pressure
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent changes the chemical structure parameters of the precursor by introducing a noble structure with specific coordination geometry and ligand arrangement. This structural parameter change simultaneously improves thermal stability (prevent decomposition) and enhances vapor pressure (facilitate vaporization), resolving the contradiction between these two properties.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The precursor employs a composite molecular structure combining tin center with organic ligands in a noble configuration. This composite approach creates a molecule that exhibits both high thermal stability from the robust coordination framework and high vapor pressure from the optimized molecular weight and intermolecular interactions, enabling successful ALD film formation.

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If conventional precursors are used, then film formation can occur, but residual carbon content remains high, reducing thin-film quality

Engineering Contradiction:
Improvethin-film qualityVSAvoidresidual carbon content
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The noble structure of the precursor changes the decomposition behavior during film formation. The specific coordination geometry and ligand arrangement promote complete decomposition and volatile byproduct formation, minimizing residual carbon incorporation in the thin-film. This parameter change in molecular structure directly improves manufacturing precision by reducing harmful residual carbon.

Inventive Principle:
Principle #35Parameter changes

3Stability of the object's composition

If precursors with high thermal stability are used, then decomposition is prevented, but vaporization becomes difficult due to strong intermolecular forces

Engineering Contradiction:
Improvethermal stabilityVSAvoidvaporization temperature
Core Design Contradiction:
Stability of the object's compositionVSTemperature

Solution Approach 1:

The noble structure optimizes the balance between intramolecular bond strength (providing thermal stability) and intermolecular interactions (affecting vaporization). The specific coordination geometry and ligand selection create a molecule that maintains structural integrity at elevated temperatures while having sufficient volatility for vapor deposition, resolving the contradiction between stability and vaporization temperature.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The tin compound allows for the formation of high-quality thin-films with reduced residual carbon content, suitable for ALD methods, due to its wide ALD window and ability to be vaporized at lower temperatures.

Implementation Method 1

The tin compound of the present invention is excellent in thermal stability and has a high vapor pressure

Methodology Applied
Scientific EffectVapor pressure: Vapour Pressure

Implementation Method 2

subjecting the tin compound in the raw material gas to decomposition and/or a chemical reaction in the treatment atmosphere, to thereby produce a thin-film containing a tin atom on a surface of the substrate

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS12415821B2Tin compound, thin-film forming raw material containing said compound, thin film formed from said thin-film forming raw material, method of producing said thin film using said compound as precursor, and method of producing said thin film
Publication Date: 2025.09.16 ADEKA CORP
  • US12415821B2 patent drawing
  • US12415821B2 patent drawing
  • US12415821B2 patent drawing

AI summary

The present invention provides a tin compound represented by the following general formula (1) (in the formula (1), R1 to R4 each independently represent a hydrogen atom or an alkyl group having 1 to 12 carbon atoms, and R5 represents an alkanediyl group having 1 to 15 carbon atoms), a thin-film forming raw material including the compound, a thin-film formed by using the thin-film forming raw material, a method of using the compound as a precursor for producing the thin-film, and a method of producing a thin-film including: introducing a raw material gas obtained by vaporizing the thin-film forming raw material into a treatment atmosphere having a substrate set therein; and subjecting the tin compound in the raw material gas to decomposition and/or a chemical reaction in the treatment atmosphere, to thereby produce a thin-film containing a tin atom on a surface of the substrate.