Transistor Surface Patterning to Suppress Carrier Traps

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Solution Overview

Problem

The production of transistors using photoresponsive materials with nitrobenzyl groups faces challenges such as carrier traps and surface defects due to hydrophilic groups, leading to unstable transistor behavior and adhesion issues with upper layers.

Innovation Solution

A method involving the formation of a photoresponsive film with a nitrobenzyl group, selective exposure to create hydrophilic and water-repellent areas, followed by plasma irradiation and surface treatment to form modified layers, which improves wettability and adhesion, reducing carrier traps and enhancing transistor characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a photoresponsive film with nitrobenzyl group is used to form patterns, then surface characteristic differentiation is achieved, but carrier traps and surface defects occur due to hydrophilic groups

Engineering Contradiction:
Improvesurface characteristic differentiationVSAvoidtransistor behavior stability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The harmful hydrophilic groups (carboxyl, amino, hydroxyl) are selectively removed from the photoresponsive film surface through plasma treatment. This extraction eliminates the source of carrier traps while preserving the beneficial surface characteristic differentiation achieved by the photoresponsive film.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The surface properties of the photoresponsive film are modified by changing the chemical composition through plasma treatment. This transforms the surface from having hydrophilic groups to having improved adhesion properties without compromising the patterned surface characteristics.

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If hydrophilic groups are present on the substrate surface, then surface treatment is simplified, but adhesion with upper layers deteriorates

Engineering Contradiction:
Improvesurface treatment easeVSAvoidadhesion strength
Core Design Contradiction:
Ease of manufactureVSStrength

Solution Approach 1:

The plasma treatment process converts the harmful hydrophilic groups into beneficial surface characteristics. The same plasma process that removes harmful groups also creates a surface with improved adhesion properties, turning a detrimental effect into a beneficial one.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Strength

If plasma irradiation is applied to remove water-repellent film, then adhesion is improved, but process complexity increases

Engineering Contradiction:
Improveadhesion strengthVSAvoidprocess steps
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The plasma treatment step serves multiple functions simultaneously: it removes harmful hydrophilic groups, eliminates water-repellent film, and creates a surface with improved adhesion properties. This consolidation of multiple functions into a single step reduces overall process complexity.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method effectively suppresses carrier traps and improves adhesion, crystallinity, and orientation, resulting in enhanced transistor performance and stability by modifying the substrate surface properties.

Implementation Method 1

selectively exposing the photoresponsive film to dissociate the photoresponsive group in an exposed area

Methodology Applied
Scientific EffectPhotodissociation: Photodissociation

Implementation Method 2

subjecting the unexposed area to a plasma irradiation to remove a water-repellent film

Methodology Applied
Scientific EffectPlasma ablation: Ablation

Data Source

PatentUS12058875B2Transistor production method
Publication Date: 2024.08.06 NIKON CORP
  • US12058875B2 patent drawing
  • US12058875B2 patent drawing
  • US12058875B2 patent drawing

AI summary

Provided is a transistor production method including: forming a gate electrode on an object by using a conductive material; forming an insulating film on the gate electrode; forming a photoresponsive film on the insulating film by using a material containing a compound having a photoresponsive nitrobenzyl group; selectively exposing the photoresponsive film to dissociate the photoresponsive group in an exposed area, forming a pattern including a hydrophilic exposed area and a water-repellent unexposed area, disposing a conductive material in the exposed area to form a source electrode and a drain electrode, and forming a modified layer by subjecting the unexposed area to a plasma irradiation to remove a water-repellent film and further subjecting to a surface treatment; and forming a semiconductor layer on the modified layer.