Trench Monocrystalline Semiconductor Structure for GaN Crack Relief
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Solution Overview
Problem
The challenge in manufacturing high-performance semiconductor devices is the thermal and lattice mismatch between silicon substrates and GaN-based materials, leading to cracking issues, particularly on large-sized silicon substrates, which complicates the production of small-sized silicon substrates.
Innovation Solution
A semiconductor structure comprising a base made of amorphous material with trenches, where a monocrystalline layer is grown within the trenches, and an epitaxial structure layer is formed on the monocrystalline layer, using laser annealing to achieve a high-quality monocrystalline layer with a (111) crystal face, reducing stress and manufacturing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If silicon substrates are used for GaN-based semiconductor devices, then thermal conductivity and electrical conductivity are improved, but thermal mismatch and lattice mismatch cause cracking in large-size devices
Solution Approach 1:
The patent divides the substrate into multiple independent islands rather than using a continuous large-size substrate. Each island is small enough to avoid cracking while maintaining good thermal and electrical conductivity. This segmentation resolves the contradiction by allowing the use of silicon substrates for their excellent conductivity properties while avoiding the cracking issue that occurs in large-size continuous substrates.
Solution Approach 2:
The patent creates local regions (islands) with specific properties optimized for their function. Each island has controlled size and shape to maintain thermal and electrical conductivity while avoiding the mismatch-induced cracking problem. The local quality principle allows different regions to have different characteristics, with each island being small enough to prevent cracking while collectively providing the required conductivity.
2Area of stationary object
If large-size silicon substrates are used, then manufacturing scale is improved, but cracking occurs due to thermal and lattice mismatch
Solution Approach 1:
Instead of using one large continuous substrate, the patent segments it into multiple smaller islands. Each island is small enough to avoid cracking while the collective area of all islands provides the necessary manufacturing scale. This resolves the contradiction between substrate size and cracking resistance by distributing the total area across multiple crack-free segments.
Solution Approach 2:
The patent transitions from a two-dimensional continuous substrate to a three-dimensional arrangement of discrete islands with varying sizes and shapes. This dimensional change allows the system to maintain large total area while each individual component remains small enough to avoid cracking, effectively resolving the size-cracking contradiction.
3Reliability
If amorphous material base with trenches is used, then cracking is alleviated and manufacturing cost is reduced, but substrate integration complexity increases
Solution Approach 1:
The patent extracts the problematic continuous substrate structure and replaces it with discrete islands on an amorphous base. The trenches are introduced to separate and isolate the islands, preventing crack propagation. This extraction of the continuous structure and replacement with discrete elements reduces cracking while the amorphous base provides a simple, low-cost foundation that doesn't add excessive complexity.
Solution Approach 2:
The patent uses an amorphous material base that is simpler and cheaper than crystalline substrates. While amorphous materials have different properties, they provide adequate support for the semiconductor islands at lower cost and with reduced cracking risk. The trenches provide the necessary structural separation without requiring complex expensive materials, resolving the contradiction between reliability and complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach alleviates the cracking issue, simplifies the manufacturing process, and enables the production of smaller, more integrated semiconductor structures with improved thermal matching, reducing production costs and enhancing the integration of GaN-based materials.
Implementation Method 1
a base, where the base includes an amorphous material
Implementation Method 2
utilizing laser annealing and chemical mechanical polishing to form high-quality monocrystalline layers
Implementation Method 3
utilizing laser annealing and chemical mechanical polishing to form high-quality monocrystalline layers
Implementation Method 4
utilizing laser annealing and chemical mechanical polishing to form high-quality monocrystalline layers
Implementation Method 5
thermal mismatch and lattice mismatch between the silicon substrates and the GaN based material lead to cracking
Implementation Method 6
thermal mismatch and lattice mismatch between the silicon substrates and the GaN based material lead to cracking
Implementation Method 7
an epitaxial structure layer, located on a side of the monocrystalline layer away from the base
Data Source
AI summary
The present application discloses a semiconductor structure including: a base, the base being made of an amorphous material and including at least one trench; a monocrystalline layer, at least part of the monocrystalline layer being provided in the trench; and an epitaxial structure layer, located on the side of the monocrystalline layer away from the base. The semiconductor structure disclosed in the present application includes the monocrystalline layer formed in the at least one trench of the base, and an amorphous material with a thermal expansion coefficient similar to that of the monocrystalline layer is selected as the base, which can relieve the tensile stress generated by the monocrystalline layer during the epitaxial process. At the same time, the epitaxial structure layer is grown on an independent monocrystalline layer, and the size is small, which alleviates the problem of semiconductor film cracking on the large-size substrate.


