Unified Static Dynamic Characterization Platform for Leakage Measurement
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Solution Overview
Problem
Current test platforms are limited in their ability to perform low current leakage measurements on high current devices, as they are typically large and expensive, and are not available in all testing environments, restricting access to both static and dynamic characterization of devices like SiC MOSFETs.
Innovation Solution
A unified static and dynamic characterization platform that combines a test and measurement device with a power delivery and measurement front end, featuring a user interface, processors, high voltage circuitry, and temperature control, allowing for simultaneous static and dynamic characterization of devices under test, including drain and gate leakage current measurements using a characterization circuit with a drain amplifier and gate amplifiers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a static test platform is used to perform leakage measurements, then measurement precision for low current is improved, but device complexity and cost increase, and portability deteriorates
Solution Approach 1:
The patent combines static and dynamic characterization capabilities into a single unified test platform. The system integrates a high voltage source, current measurement circuitry with high precision amplifiers, temperature control, and switching circuitry into one compact device that can perform both low current leakage measurements and high current dynamic tests, eliminating the need for separate specialized equipment.
Solution Approach 2:
The test platform is designed with multi-functionality to perform various characterization tasks including static I-V curves, dynamic switching measurements, and leakage current measurements across different current ranges. The system uses reconfigurable circuitry and switching mechanisms to adapt between different measurement modes, providing universal testing capability in a single device.
2Measurement precision
If a static test platform is used to perform leakage measurements, then measurement precision for low current is improved, but portability deteriorates
Solution Approach 1:
The patent combines static and dynamic characterization capabilities into a single unified test platform. The system integrates a high voltage source, current measurement circuitry with high precision amplifiers, temperature control, and switching circuitry into one compact device that can perform both low current leakage measurements and high current dynamic tests, eliminating the need for separate specialized equipment.
3Measurement precision
If separate static and dynamic test platforms are used, then measurement precision for specific parameters is improved, but productivity deteriorates
Solution Approach 1:
The patent combines static and dynamic characterization capabilities into a single unified test platform. The system integrates a high voltage source, current measurement circuitry with high precision amplifiers, temperature control, and switching circuitry into one compact device that can perform both low current leakage measurements and high current dynamic tests, eliminating the need for separate specialized equipment.
Solution Approach 2:
The system employs dynamic switching circuitry that can rapidly reconfigure between different measurement modes. The switching mechanisms allow the platform to transition between static and dynamic characterization tasks without requiring physical reconfiguration or equipment changes, enabling seamless multi-function operation that maintains precision while improving throughput.
Data Source
AI summary
A testing system includes a Device Under Test (DUT) interface structured to couple to one or more DUTs and a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs. The device characterization circuit includes a drain amplifier coupled to a drain of the one or more DUTs that is structured to measure drain leakage current. Methods of measuring drain current in a device that performs both static and dynamic testing are also described.