Uniform Etch Imprinting Layer via Evaporation Control

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Solution Overview

Problem

Conventional etching techniques face challenges in achieving uniform etch rates during micro-fabrication, leading to non-uniformity in the formation of layers, which affects the quality and yield of micro-fabricated structures.

Innovation Solution

A method is developed to form layers with uniform etch characteristics by controlling the relative rates of evaporation of components in a polymerizable liquid composition, ensuring that the silicon content remains consistent across the surface, thereby minimizing etch non-uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional etching techniques are used, then etching can be performed, but uniform etch rate cannot be achieved

Engineering Contradiction:
Improveetch rate uniformityVSAvoidlayer formation quality
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies preliminary action by controlling the evaporation rates of components during the deposition of the imprinting layer composition. By adjusting the deposition conditions beforehand to achieve uniform component distribution and silicon content, the etch uniformity problem is prevented before the etching process begins. This eliminates the need for complex real-time etch rate control during the actual etching step.

Inventive Principle:
Principle #10Preliminary action

2Quantity of substance

If the polymerizable liquid composition is deposited, then the imprinting layer is formed, but non-uniform silicon distribution occurs due to evaporation

Engineering Contradiction:
Improvesilicon content uniformityVSAvoidcomposition uniformity
Core Design Contradiction:
Quantity of substanceVSStability of the object's composition

Solution Approach 1:

The patent applies parameter changes by carefully controlling the deposition parameters of the polymerizable liquid composition. By adjusting deposition rate, temperature, and other parameters, the evaporation of volatile components is controlled to maintain uniform silicon content and composition throughout the imprinting layer, preventing non-uniformity during subsequent etching.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method achieves a uniform silicon distribution and density in the solidified imprinting layer, reducing etch non-uniformity and enhancing the quality and consistency of micro-fabricated patterns, while maintaining mechanical strength and release properties.

Implementation Method 1

Each of the components has a rate of evaporation associated therewith. A relative rate of evaporation associated with a subset of the plurality of components is established to be within a predetermined range.

Methodology Applied
Scientific EffectEvaporation: Evaporation

Implementation Method 2

The polymerizable composition is then solidified. The method achieves a uniform silicon distribution and density in the solidified imprinting layer

Methodology Applied
Scientific EffectSolidification: Phase Change

Data Source

PatentUS7939131B2Method to provide a layer with uniform etch characteristics
Publication Date: 2011.05.10 CANON KK
  • US7939131B2 patent drawing
  • US7939131B2 patent drawing
  • US7939131B2 patent drawing

AI summary

The present invention includes a method and a composition to form a layer on a substrate having uniform etch characteristics. To that end, the method includes controlling variations in the characteristics of a solid layer, such etch characteristics over the area of the solid layer as a function of the relative rates of evaporation of the liquid components that comprise the composition from which the solid layer is formed.