Multi-Port USB Hub for Refurbished Device Testing
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Solution Overview
Problem
Existing multi-port hubs for testing refurbished computing devices have limited bandwidth and throughput, leading to slowed testing processes and increased likelihood of timeout failures and communication bus busy errors, which restrict the number of devices that can be tested and resold.
Innovation Solution
A multi-port hub with 40 ports, each providing an average bandwidth of 240 Mbps, significantly increasing the number of devices that can be tested simultaneously and improving throughput by 80-200 units per hour.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a multi-port hub is used to connect multiple devices under test to a computer system, then the number of devices that can be tested simultaneously increases, but the bandwidth per port decreases leading to timeout failures and communication bus busy errors
Solution Approach 1:
The system segments the testing workflow into multiple stages: active testing phase where a limited number of devices (within bandwidth capacity) are actively communicating with the computer system, and standby phase where additional devices are connected but not actively tested. The hub segments the device queue into active and standby groups, allowing more devices to be connected simultaneously while maintaining communication reliability by limiting active connections to the bandwidth capacity of 68 Mbps.
Solution Approach 2:
The system implements periodic action by cycling devices through different testing phases. Devices transition from standby to active testing and back to standby in a periodic manner, ensuring that the total active device count never exceeds the bandwidth capacity threshold. This periodic rotation allows all connected devices to eventually be tested while preventing communication errors during any given time period.
2Reliability
If the bandwidth per port is increased to prevent timeout failures, then the number of devices that can be tested simultaneously decreases, reducing overall throughput
Solution Approach 1:
The system merges multiple device testing operations into coordinated batches. Devices are grouped and tested in sequences that optimize bandwidth utilization, combining the throughput benefits of multiple devices with the reliability of limited concurrent connections. The hub merges the active and standby device groups, managing transitions to maintain both high reliability and maximum throughput.
Solution Approach 2:
The system maintains continuity of useful action by ensuring that as one device completes testing and returns to the pool, another device immediately transitions from standby to active testing. This continuous rotation eliminates idle time on the communication bus, maintaining high throughput while keeping the number of simultaneous active connections within the reliability threshold.
3Quantity of substance
If more ports are added to the hub to increase device capacity, then the bandwidth per port is further reduced, increasing timeout failures and bus busy errors
Solution Approach 1:
The system performs preliminary action by pre-connecting standby devices to the hub before they are actively tested. Devices are prepared and positioned in the standby queue in advance, so when an active testing slot becomes available, the transition to active testing can occur immediately without connection delays. This preliminary positioning reduces the total testing duration despite having many connected devices.
Solution Approach 2:
The system implements dynamics by making the active device count adjustable and time-dependent. The number of simultaneously active devices is not fixed but dynamically adjusted based on testing progress, device availability, and communication conditions. This dynamic management allows the system to adapt to changing conditions and optimize the balance between device capacity and testing speed.
Data Source
AI summary
A device may include a housing. A device may include a plurality of universal serial bus (USB) ports configured to be connected to a plurality of devices under test. The plurality of USB ports is configured be connected to a connector in groups of two. The respective connectors are configured to be connected to a peripheral communication interface (PCI) bridge.