Variable-Depth Nanoimprint Master Fabrication for Precise Feature Heights

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Solution Overview

Problem

Current nanoimprint lithography methods struggle with the efficient and precise fabrication of complex nano-structured devices that require varying depths in a single substrate, often necessitating multiple and complex photolithography steps, which are time-consuming and expensive, and are not compatible with conventional CMOS processing tools.

Innovation Solution

A method for producing a master template with variable height features using a layer stack comprising a substrate, etch stop layer, and pattern layer, where height gradation is created through lithography and etching processes, allowing for the integration of continuous or 2D height variation and precise patterning of features.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If multiple photolithography steps are used to create variable depth features, then manufacturing precision is improved, but device complexity and production time increase

Engineering Contradiction:
Improvefeature depth precisionVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention segments the master template into multiple layers (first pattern layer, second pattern layer, third pattern layer) with different etch selectivities. Each layer is patterned separately through lithography and etching processes, allowing independent control of feature depths at different spatial locations. This layered segmentation enables complex variable depth profiles to be achieved through sequential processing of simpler individual layers.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention applies local quality by using different etch selectivities for different pattern layers. The first pattern layer has higher etch selectivity than the second pattern layer, allowing selective removal of material at specific locations. This enables different regions of the master template to have different feature depths and geometries, achieving variable depth features tailored to local requirements while using standard lithography tools.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If multiple photolithography steps are used to create variable depth features, then manufacturing precision is improved, but production time increases

Engineering Contradiction:
Improvefeature depth precisionVSAvoidproduction speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The invention performs preliminary patterning of multiple pattern layers with different etch selectivities before the final imprinting step. The first, second, and third pattern layers are prepared in advance with specific depth profiles and geometries. This preliminary preparation allows the actual imprinting process to transfer all variable depth features in a single step, rather than requiring multiple sequential lithography-etch cycles for each feature depth variation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention uses imprint lithography to copy the complex variable depth master template onto the device substrate in a single high-throughput step. The master template, which contains all the pre-prepared variable depth features from multiple pattern layers, is used as a stamp to replicate the entire complex structure simultaneously across the substrate, dramatically increasing production speed compared to sequential processing.

Inventive Principle:
Principle #26Copying

3Manufacturing precision

If conventional photolithography tools are used for complex patterning, then manufacturing precision is improved, but adaptability to different substrates decreases

Engineering Contradiction:
Improvepatterning precisionVSAvoidsubstrate compatibility
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The invention introduces a pattern layer as an intermediary between the lithography tool and the final device structure. The pattern layer with controlled etch selectivity acts as a mediator that enables standard lithography tools to create complex variable depth features on diverse substrates. This intermediary layer decouples the patterning process from substrate-specific requirements, allowing the same lithography approach to work across different substrate materials and types.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The invention changes the etch selectivity parameter of the pattern layers to achieve different feature depths and geometries. By controlling the etch selectivity ratios between different pattern layers, the process can be adapted to create various depth profiles without changing the fundamental lithography approach or requiring substrate-specific tooling, thereby maintaining both precision and substrate versatility.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and affordable replication of variable height features on device substrates, enhancing the uniformity and efficiency of diffraction-based waveguide displays by integrating continuous height variation and multi-step features in a single nanoimprint master, compatible with standard CMOS materials.

Implementation Method 1

the pattern may be provided by applying a lithographic process to the height graded pattern layer

Methodology Applied
Scientific EffectPhotolithography: Photography

Implementation Method 2

creating height gradation in the at least one pattern layer to obtain a height graded pattern layer; and forming the master template by providing a pattern comprising a plurality of features into the height graded pattern layer

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS20260016746A1Method for Fabrication of Variable Depth Print Master for Nanoimprint Lithography
Publication Date: 2026.01.15 INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
  • US20260016746A1 patent drawing
  • US20260016746A1 patent drawing

AI summary

A method is for producing a master template with variable height features for imprint lithography on a device substrate includes providing a layer stack comprising a substrate, an etch stop layer on the substrate, and a pattern layer on the etch stop layer. The method involves creating height gradation in the pattern layer to obtain a height graded pattern layer, forming the master template by providing a pattern comprising a plurality of features into the height graded pattern layer. This method enables the production of features with varying heights, which can be particularly useful in applications such as optical devices where such features may influence the functionality and efficiency of the device.