Variable Pitch Metal Segments for IC Routing Flexibility

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Solution Overview

Problem

Current IC layout diagram generation methods face limitations in routing flexibility and chip area utilization due to fixed pitch ratios between metal layers, which restricts the compact arrangement of layout features and increases design rule check violations.

Innovation Solution

The method involves arranging metal segments in multiple layers with varying pitches, specifically a third layer with a smaller pitch than the second layer, allowing for increased routing flexibility and improved chip area utilization by enabling more compact arrangements of layout features.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If fixed pitch ratios between metal layers are used, then manufacturing simplicity is maintained, but routing flexibility deteriorates

Engineering Contradiction:
Improverouting flexibilityVSAvoidpitch ratio complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent changes the pitch parameter of metal layers from fixed ratios to variable ratios. Specifically, it sets the pitch of the third metal layer to be smaller than that of the second metal layer, breaking the traditional fixed pitch ratio convention. This parameter change enables more flexible routing paths and improves adaptability in IC layout design.

Inventive Principle:
Principle #35Parameter changes

2Area of stationary object

If fixed pitch ratios between metal layers are used, then design rule check compliance is improved, but chip area utilization deteriorates

Engineering Contradiction:
Improvechip area utilizationVSAvoiddesign rule check compliance
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent modifies the pitch parameter of the third metal layer to be smaller than the second metal layer's pitch. This parameter change allows for more compact arrangement of layout features, increasing chip area utilization while still maintaining design rule compliance through controlled pitch reduction.

Inventive Principle:
Principle #35Parameter changes

3Adaptability or versatility

If smaller pitch in third metal layer is implemented, then routing flexibility is improved, but manufacturing complexity increases

Engineering Contradiction:
Improverouting flexibilityVSAvoidmanufacturing complexity
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The patent applies local quality by reducing the pitch only in the third metal layer where it is most needed for routing flexibility, while maintaining larger pitches in other layers. This localized pitch reduction optimizes routing capabilities in critical areas without unnecessarily complicating the entire manufacturing process.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS20210248298A1Integrated circuit structure
Publication Date: 2021.08.12 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20210248298A1 patent drawing
  • US20210248298A1 patent drawing
  • US20210248298A1 patent drawing

AI summary

An IC structure includes a first plurality of metal segments extending in a first metal layer in a first direction and having a first pitch in a second direction perpendicular to the first direction, a second plurality of metal segments extending in a second metal layer in the second direction and having a second pitch in the first direction, and a third plurality of metal segments extending in a third metal layer in the first direction and having a third pitch in the second direction. The second metal layer is a next consecutive layer overlying the first metal layer, the third metal layer is a next consecutive layer overlying the second metal layer, and a ratio of the second pitch to the third pitch is greater than one.