Vertical Organic Field Effect Transistor Electrode Patterning

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Solution Overview

Problem

Current methods for producing organic field effect transistors (OFETs) face challenges in achieving high current densities and controllable production processes, particularly in vertical OFETs (VOFETs), which require sophisticated lithography and struggle with asymmetric responses to Drain-Source voltages.

Innovation Solution

A method involving the sequential deposition of organic semiconducting layers and doping material layers, with photo-lithographic structuring, to create a vertical transistor design where the first and second electrodes are generated partially on doping material layers, reducing parallel resistance and enhancing the current ratio between ON and OFF states, and using a dual layer photoresist for precise patterning.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional lithography methods are used to pattern electrodes in vertical OFETs, then manufacturing precision can be achieved, but device complexity and production difficulty increase significantly

Engineering Contradiction:
Improveelectrode patterning precisionVSAvoidproduction process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by depositing doping material layers (such as F4-TCNQ or MoO3) before electrode formation. This pre-deposition enables subsequent electrode patterning through simple lift-off processes rather than complex lithography, reducing manufacturing steps while maintaining precision. The doping layers are deposited in specific regions that will become electrode contact areas, preparing the structure in advance for easy electrode definition.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent segments the device structure by separating the doping function from the electrode function. Doping material layers are deposited in specific regions before electrode formation, creating distinct functional zones. This segmentation allows independent optimization of doping regions and electrode patterns, simplifying the overall manufacturing process while achieving precise electrode definition through material deposition rather than complex lithography.

Inventive Principle:
Principle #1Segmentation

2Reliability

If doping material layers are deposited before electrode formation, then current density increases due to reduced parallel resistance, but manufacturing process complexity increases

Engineering Contradiction:
Improvecurrent densityVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges multiple functions into the doping material layer deposition step. By depositing doping materials (F4-TCNQ, MoO3, etc.) in specific regions before electrode formation, the process simultaneously achieves: (1) charge carrier generation in the organic semiconductor, (2) formation of low-resistance contact regions, and (3) definition of electrode contact areas. This merging reduces the need for separate manufacturing steps while achieving high current density through reduced parallel resistance at electrode interfaces.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The doping material layers serve as intermediary elements between the electrode and the organic semiconductor channel. Materials like F4-TCNQ and MoO3 are deposited in contact regions to create intermediate layers that facilitate charge transfer, reduce contact resistance, and enable high current density. These intermediary doping layers mediate the interface between metal electrodes and organic semiconductors, improving electrical performance without requiring complex electrode structuring.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If vertical OFET structure is used to achieve high current density, then transistor performance improves, but asymmetric response to Drain-Source voltages occurs

Engineering Contradiction:
Improvetransistor performanceVSAvoidvoltage response symmetry
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent applies local quality by creating asymmetric doping profiles in the vertical OFET structure. Different doping materials and concentrations are used in the source and drain contact regions to compensate for the inherent asymmetry in vertical device geometry. For example, one contact may use F4-TCNQ while the other uses MoO3, or different deposition thicknesses are applied. This local differentiation of doping quality balances the charge injection characteristics at source and drain, achieving symmetric voltage response while maintaining high current density performance.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for the production of high-performance OFETs with increased current densities and improved controllability, enabling the fabrication of transistors with high on/off ratios and reduced overlap capacitances, suitable for high-frequency operations and complementary circuits.

Implementation Method 1

The photoresist layer is illuminated with UV light to a dose of 35 mJ/cm2

Methodology Applied
Scientific EffectPhotoabsorption: Absorption (EM radiation)

Implementation Method 2

The first and second organic semiconducting layers are configured to transport charge carriers of the same type, namely holes and electrons

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 3

generating a first doping material layer on the first organic semiconducting layer prior to generating the first electrode

Methodology Applied
Scientific EffectDoping: Dopants

Data Source

PatentUS9705098B2Method for producing an organic field effect transistor and an organic field effect transistor
Publication Date: 2017.07.11 NOVALED GMBH
  • US9705098B2 patent drawing
  • US9705098B2 patent drawing
  • US9705098B2 patent drawing

AI summary

The disclosure relates to a method for producing an organic field effect transistor, including providing a gate electrode and a gate insulator, depositing a first organic semiconducting layer on the gate insulator, generating a first electrode and an electrode insulator assigned to the first electrode for electrical insulation, depositing a second organic semiconducting layer on the first organic semiconducting layer and the electrode insulator, and generating a second electrode. Furthermore, an organic field effect transistor is provided.