Vertical Probe Arched Shape Narrow Pitch Assembly
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Solution Overview
Problem
Existing vertical probes and jigs face limitations in achieving narrow pitch due to insulating coatings acting as obstacles, complex shapes causing assembly difficulties, high straightness requirements for straight pins, and insufficient overdrive, which hinder the miniaturization and refinement of semiconductor devices.
Innovation Solution
A vertical probe and jig system where straight pins are plastically deformed within the jig to form an arched shape, eliminating the need for insulating coatings and allowing for easy assembly and insertion, while ensuring sufficient flexibility and overdrive, similar to the cobra probe's contact force and overdrive characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If insulating coating is provided on the vertical probe to prevent falling, then the probe can be prevented from falling, but the thickness of the coating film becomes an obstacle to narrowing the pitch
Solution Approach 1:
The patent extracts the fall prevention function from the insulating coating and transfers it to a dedicated stopper structure. The stopper is a separate component with a specific shape designed to engage with the probe holder, separating the electrical insulation function from the mechanical retention function. This allows the insulating coating to be thin or absent while maintaining fall prevention through the geometric design of the stopper.
Solution Approach 2:
The patent segments the vertical probe into multiple functional parts: a conductive core, a thin insulating coating, and a separate stopper structure. This segmentation allows each component to be optimized independently - the conductive core for electrical function, the thin coating for minimal pitch obstruction, and the stopper for fall prevention, thereby achieving narrow pitch without compromising reliability.
2Ease of manufacture
If the probe is shaped to have a stopper function to eliminate coating or crushing treatment, then the need for coating is eliminated, but the shape of the probe becomes complex and difficult to incorporate into a jig
Solution Approach 1:
The patent separates the stopper function into a distinct component that can be independently manufactured and then assembled to the probe. This segmentation maintains probe simplicity for manufacturing while adding the stopper function through a separate part, avoiding the need for complex integrated shapes or additional coating processes.
3Device complexity
If straight pins are used for vertical probes, then the structure is simple, but high straightness requirements make manufacturing difficult
Solution Approach 1:
The patent changes the geometric parameters of the pin by introducing a slight curvature or bending in the stopper portion. This parameter change allows the pin to achieve the necessary stopper function without requiring extremely high straightness over the entire length, as the curvature is localized to a specific region and can be more easily manufactured.
4Length of moving object
If the pitch is narrowed by reducing probe diameter, then the pitch can be narrowed, but the limitation of narrowing pitch has been reached
Solution Approach 1:
The patent transitions from preventing fall through radial dimension (thick insulating coating) to preventing fall through axial dimension (stopper protrusion). By extending the stopper function in the axial direction rather than relying on radial thickness, the probe can maintain narrow pitch while achieving reliable fall prevention through the stopper's engagement with the probe holder.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates handling of narrow pitches, reduces costs and delivery time, ensures precise alignment and uniform contact force, and improves the reliability of electrical continuity inspections by eliminating interference and achieving cost-effective production.
Implementation Method 1
the positions of the upper and lower hole plates are relatively moved and positioned to plastically deform the straight pins and to make the vertical probe between the upper and lower hole plates is formed into an arched shape
Data Source
AI summary
The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.