Vertically Spaced Die Attach Pads Preventing Air Voids
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Solution Overview
Problem
Integrated circuit packages face partial dielectric discharge failures due to air voids in the mold compound filling the gap between die attach pads, which existing designs fail to adequately address without increasing lateral spacing or changing die sizes.
Innovation Solution
The leadframe design features die attach pads positioned at different elevations with sloped or rounded edge surfaces, increasing the effective separation distance without altering the package footprint or die sizes, ensuring complete mold compound filling and preventing partial discharge failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If die attach pads are positioned closer together to maintain package footprint, then manufacturing efficiency is improved, but partial dielectric discharge failures occur due to air voids in mold compound
Solution Approach 1:
The patent transitions from lateral spacing to vertical spacing by positioning die attach pads at different elevations. The first die attach pad is at a first elevation and the second die attach pad is at a second elevation, creating vertical separation that prevents air void formation while maintaining close lateral proximity for manufacturing efficiency
Solution Approach 2:
The patent changes the spatial parameter from horizontal distance to vertical distance between die attach pads. By positioning pads at different elevations with sloped or rounded edge surfaces, the effective separation distance is increased in the vertical dimension while lateral footprint remains compact
2Reliability
If lateral spacing between die attach pads is increased to prevent discharge failures, then reliability is improved, but package footprint increases
Solution Approach 1:
The patent resolves the footprint issue by moving the separation dimension from lateral to vertical. Die attach pads are positioned at different elevations rather than being laterally spaced, which prevents discharge failures without increasing the horizontal package footprint
3Productivity
If die sizes are reduced to accommodate closer pad spacing, then manufacturing efficiency is improved, but electrical performance deteriorates
Solution Approach 1:
The patent enables close lateral pad spacing with full-sized dies by introducing vertical separation. The different elevations and sloped/rounded edge surfaces prevent air void formation, allowing large dies to be positioned close together laterally without compromising electrical performance or manufacturing efficiency
Data Source
AI summary
A leadframe includes a first die attach pad (“DAP”) having a first longitudinally extending edge surface and a second DAP having a first longitudinally extending edge surface. The second DAP is positioned with the first longitudinally extending edge surface thereof in adjacent, laterally and vertically spaced relationship with the first longitudinally extending edge surface of the first DAP.


