Voltage Control Apparatus for Burn-In Test Peak Current Distribution
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Solution Overview
Problem
The existing voltage control apparatuses for semiconductor integrated circuits, particularly during burn-in tests, generate excessive peak current that can lead to solder ball melting and reduced package yield, and fail to accurately screen defects in peripheral transistors during column-fast operations.
Innovation Solution
A voltage control apparatus that includes a signal generator and a voltage controller, which outputs a burn-in control signal and a precharge signal to supply either a first voltage or a second voltage lower than the first voltage to the word line, distributing peak current during active and precharge operations to prevent overheating and ensure accurate defect screening.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a row-fast (X-Fast) operation is performed during burn-in test, then the burn-in test can be completed, but excessive peak current is generated that melts solder balls and reduces package yield
Solution Approach 1:
The patent applies preliminary action by performing a precharge operation before the active operation during burn-in test. This precharge operation prepares the word line voltage in advance, preventing excessive peak current during the subsequent active operation. The precharge signal is generated specifically for burn-in test mode to advance-charge the word line, thereby eliminating the harmful peak current effect on solder balls while maintaining burn-in test effectiveness.
2Object-affected harmful factors
If a column-fast (Y-Fast) operation is performed during burn-in test, then peak current is reduced, but peripheral transistor defects cannot be accurately screened
Solution Approach 1:
The patent applies dynamics by dynamically switching between row-fast and column-fast operations during burn-in test. The system performs column-fast operation for normal operations to reduce peak current, and switches to row-fast operation specifically during burn-in test mode to enable accurate peripheral transistor defect screening. This dynamic operation mode switching allows the system to optimize for different requirements at different times.
3Reliability
If active operation is performed frequently, then burn-in test coverage is improved, but large peak current is generated that causes overheating
Solution Approach 1:
The patent applies preliminary action by generating a precharge signal that advances the charging of the word line before the active operation occurs. This preliminary precharge action reduces the voltage swing required during the active operation, thereby reducing the peak current and associated overheating while maintaining adequate burn-in test coverage through controlled active operations.
Data Source
AI summary
A voltage control apparatus and a method of controlling a voltage using the same. A voltage control apparatus includes a signal generator configured to output a burn-in control signal and a burn-in precharge signal in response to an all bank precharge command, and a voltage controller configured to supply either a first voltage or a second voltage lower than the first voltage to a word line in response to the burn-in control signal and the burn-in precharge signal.