Temperature-Compensated Voltage Sampling for Leakage-Induced Droop

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Solution Overview

Problem

Voltage sampling circuits face limitations due to increased leakage currents at higher temperatures, leading to unacceptable voltage droop, which restricts the operating temperature range.

Innovation Solution

A voltage sampling circuit arrangement that adjusts the oscillator frequency by increasing the bias current in response to rising temperature-induced leakage currents, using a biasing circuit that matches the temperature dependence of the sampling circuit leakage, thereby maintaining voltage droop within design limits across a wider temperature range.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the sampling frequency is increased to compensate for increased leakage current at higher temperatures, then the voltage droop is reduced, but the power consumption increases

Engineering Contradiction:
Improvevoltage droopVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The oscillator frequency is made dynamically adjustable based on temperature conditions. The biasing circuit modifies the oscillator's operating point in response to temperature changes, allowing the sampling frequency to adapt automatically. This dynamic adjustment enables the system to maintain acceptable voltage droop at high temperatures by increasing frequency only when necessary, rather than operating at high frequency continuously, thus reducing overall power consumption while maintaining reliability.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the oscillation frequency parameter in response to temperature-induced leakage current variations. By modifying the frequency parameter dynamically based on environmental conditions, the circuit optimizes the trade-off between voltage droop compensation and power consumption, achieving reliable operation across a wider temperature range without excessive energy use.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the sampling frequency is increased to compensate for increased leakage current at higher temperatures, then the voltage droop is reduced, but the device complexity increases

Engineering Contradiction:
Improvevoltage droopVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The biasing circuit is designed to automatically sense temperature effects and self-adjust the oscillator frequency without external control. The circuit uses its own internal components to detect leakage current changes and respond by modifying the sampling frequency, eliminating the need for complex external temperature sensors or control logic. This self-service approach maintains reliability while minimizing added complexity.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The biasing circuit functionality is merged with the existing oscillator and sampling circuitry. Rather than adding a separate temperature compensation system, the invention integrates the frequency adjustment mechanism into the existing circuit architecture, using shared components and combined functionality to achieve temperature compensation without proportionally increasing overall device complexity.

Inventive Principle:
Principle #5Merging (Combining)

3Device complexity

If a fixed sampling frequency is used, then the circuit design is simpler, but the operating temperature range is limited due to voltage droop at high temperatures

Engineering Contradiction:
Improvecircuit designVSAvoidoperating temperature range
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The oscillator frequency is made dynamically adjustable based on temperature conditions. The biasing circuit modifies the oscillator's operating point in response to temperature changes, allowing the sampling frequency to adapt automatically. This dynamic adjustment enables the system to maintain acceptable voltage droop at high temperatures by increasing frequency only when necessary, rather than operating at high frequency continuously, thus reducing overall power consumption while maintaining reliability.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the oscillation frequency parameter in response to temperature-induced leakage current variations. By modifying the frequency parameter dynamically based on environmental conditions, the circuit optimizes the trade-off between voltage droop compensation and power consumption, achieving reliable operation across a wider temperature range without excessive energy use.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution effectively compensates for increased leakage currents at higher temperatures by increasing the oscillator frequency, ensuring the voltage droop remains within acceptable limits, thus expanding the operating temperature range of the circuit.

Implementation Method 1

said sampling circuit portion has a current leakage dependent on temperature

Methodology Applied
Scientific EffectTemperature dependence of leakage current:

Implementation Method 2

said bias current is dependent on temperature

Methodology Applied
Scientific EffectTemperature dependence of bias current:

Data Source

PatentUS10833659B2Voltage sampling circuits
Publication Date: 2020.11.10 NORDIC SEMICONDUCTOR
  • US10833659B2 patent drawing
  • US10833659B2 patent drawing
  • US10833659B2 patent drawing

AI summary

A voltage sampling circuit arrangement comprises: an oscillator circuit portion arranged to produce a periodic oscillator output signal at an oscillation frequency dependent on a bias current provided thereto; a sampling circuit portion arranged selectively to connect an input terminal (Vin) to an output terminal (Vout) in response to an applied switching signal (Vswitch) derived from said oscillator output signal, wherein said sampling circuit portion has a current leakage dependent on temperature; and a biasing circuit portion arranged to provide said bias current to the oscillator circuit portion wherein said bias current is dependent on temperature.