Wafer Grinding Bridge Casting Stiffness Loop

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional wafer grinding technologies face challenges in achieving precise thickness reduction and maintaining wafer quality, particularly in semiconductor manufacturing, where achieving thin wafer thickness is crucial for electronic chip production, and existing methods lack the necessary precision and efficiency in grinding hard materials like silicon carbide and sapphire.

Innovation Solution

The proposed solution involves a grinding system with a rotary indexer and bridge casting configuration that supports a coaxial grind spindle with nested coarse and fine grind wheels, allowing for precise alignment and rotation of grind wheels to achieve desired thicknesses, along with a vacuum system for secure wafer placement and a counterbalance to prevent structural shifting, enabling efficient grinding of hard materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional grinding methods are used to reduce wafer thickness, then throughput is improved, but manufacturing precision deteriorates

Engineering Contradiction:
ImprovethroughputVSAvoidthickness precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The grinding process is segmented into multiple independent grinding stations positioned around a rotary indexer, with each station equipped with its own grind wheel and control system. This allows simultaneous multi-point grinding operations while maintaining precise thickness control at each station, resolving the contradiction between high throughput and manufacturing precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system incorporates real-time thickness measurement and feedback control mechanisms that continuously monitor wafer thickness during grinding and automatically adjust grinding parameters. This closed-loop control enables high-speed grinding operations while maintaining precise thickness specifications, addressing the contradiction between productivity and manufacturing precision.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If pressure is applied during grinding to achieve desired thickness, then manufacturing precision is improved, but wafer quality deteriorates

Engineering Contradiction:
Improvethickness controlVSAvoidwafer quality
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The grinding system employs dynamic pressure control that adjusts applied pressure in real-time based on wafer thickness measurements and grinding progress. The system transitions from static high-pressure grinding to dynamic adaptive pressure application, maintaining precise thickness control while minimizing wafer damage and preserving wafer quality.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes multiple grinding parameters simultaneously including pressure, feed rate, and grind wheel speed based on real-time conditions. By dynamically adjusting these parameters, the system achieves precise thickness control without applying excessive pressure that would damage wafer quality, resolving the contradiction between manufacturing precision and wafer quality.

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If conventional grinding apparatus is used, then device complexity is reduced, but manufacturing precision deteriorates

Engineering Contradiction:
Improveapparatus structureVSAvoidgrinding accuracy
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The rotary indexer serves multiple functions: positioning wafers at different grinding stations, rotating wafers during grinding, and coordinating between multiple grind spindles. This multi-functional design achieves high manufacturing precision without proportionally increasing device complexity, as one component performs several critical functions simultaneously.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system incorporates self-aligning and self-adjusting mechanisms where the rotary indexer automatically positions wafers and coordinates grinding operations without external intervention. The apparatus uses internal feedback loops and automated control systems that manage complexity internally while maintaining high manufacturing precision, resolving the contradiction between device complexity and manufacturing precision.

Inventive Principle:
Principle #25Self-service

4Adaptability or versatility

If hard materials like silicon carbide and sapphire are ground, then product versatility is improved, but manufacturing precision deteriorates

Engineering Contradiction:
Improvematerial processing capabilityVSAvoidgrinding accuracy
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The system employs different grind wheel compositions and characteristics at different grinding stations, optimized for specific material types. Each grinding station can be configured with appropriate abrasive materials and wheel properties tailored to the specific wafer material being processed, enabling high-precision grinding of hard materials like silicon carbide and sapphire while maintaining versatility across different material types.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system dynamically adjusts grinding parameters including wheel speed, feed rate, and applied pressure based on the specific material being processed. This material-adaptive parameter control enables precise grinding of various hard materials by optimizing process conditions for each material type, resolving the contradiction between product versatility and manufacturing precision.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration allows for precise control over wafer thickness, achieving thinness down to 100 microns or less, with enhanced stiffness and accuracy, improving wafer quality and throughput by minimizing vibrations and maintaining spindle alignment during grinding.

Implementation Method 1

applying a vacuum pressure to secure a wafer to the work chuck

Methodology Applied
Scientific EffectVacuum pressure: Vacuum

Data Source

PatentUS8968052B2Systems and methods of wafer grinding
Publication Date: 2015.03.03 REVASUM INC
  • US8968052B2 patent drawing
  • US8968052B2 patent drawing
  • US8968052B2 patent drawing

AI summary

Systems and methods are provided for use in processing and/or grinding wafers or other work products. Some embodiments provide a grinding apparatus that comprise a base casting; a rotary indexer configured to rotate within the base casting; a work spindle secured with the rotary indexer; a work chuck coupled with the first work spindle, wherein the first work spindle is configured to rotate the first work chuck; a bridge casting secured relative to the base casting, wherein the bridge casting bridges across at least a portion of the rotary indexer and is supported structurally forming a closed stiffness loop; a grind spindle secured with the bridge casting; and a grind wheel cooperated with the grind spindle, wherein the bridge casting secures the grind spindle.