Wafer Level Package Reinforcement Zig for Warpage Control

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Solution Overview

Problem

The warpage and chip shift phenomena pose challenges in fabricating reliable fan-out wafer level packages (FOWLPs), which are essential for producing compact and reliable semiconductor devices without printed circuit boards.

Innovation Solution

A wafer level package design that includes semiconductor chips attached to a carrier with a reinforcement zig structure, where a molded layer covers and embeds the reinforcement zig, providing additional adhesive strength and preventing chip movement during the molding process, thus addressing warpage and chip shift issues.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If semiconductor chips are attached to a carrier for FOWLP fabrication, then chip density and integration are improved, but warpage and chip shift phenomena occur during molding

Engineering Contradiction:
Improvechip densityVSAvoidfabrication reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The reinforcement zig structure is attached to the carrier before the semiconductor chips are mounted. This preliminary placement of the reinforcement structure prepares the substrate to resist warpage forces before molding occurs, preventing both warpage and chip shift during the subsequent molding process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The reinforcement zig structure serves as a composite element combining the carrier substrate with an additional reinforcement layer. This composite structure provides enhanced mechanical strength and dimensional stability, allowing high chip density while maintaining fabrication reliability by resisting warpage during molding

Inventive Principle:
Principle #40Composite materials

2Volume of moving object

If chip size is reduced to enable compact mobile products, then device compactness is improved, but adhesive strength between chip and carrier becomes insufficient

Engineering Contradiction:
Improvechip sizeVSAvoidadhesive strength
Core Design Contradiction:
Volume of moving objectVSStrength

Solution Approach 1:

Instead of relying solely on the limited bonding area of small chips, the reinforcement zig structure extends the adhesive interface into a larger peripheral region. This dimensional extension provides additional bonding area and distributes mechanical stresses, enhancing adhesive strength while maintaining small chip size for compact devices

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of manufacture

If standardized ball layout is used to simplify PCB design, then manufacturing ease is improved, but chip stability during molding deteriorates due to warpage

Engineering Contradiction:
Improvemanufacturing easeVSAvoidchip stability
Core Design Contradiction:
Ease of manufactureVSStability of the object's composition

Solution Approach 1:

The reinforcement zig structure is installed before chip mounting and molding to preemptively counteract warpage forces. This preliminary reinforcement ensures chip stability throughout the molding process while allowing the use of standardized ball layouts that simplify manufacturing and PCB design

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10559539B2Wafer level packages, semiconductor device units, and methods of fabricating the same
Publication Date: 2020.02.11 SK HYNIX INC
  • US10559539B2 patent drawing
  • US10559539B2 patent drawing
  • US10559539B2 patent drawing

AI summary

A wafer level package and or a semiconductor device unit may be provided. The wafer level package may include semiconductor chips disposed on an interconnection structure layer and laterally spaced apart from each other. The wafer level package may include a reinforcement zig attached to the semiconductor chips. The wafer level package may include a molded layer covering the semiconductor chips and embedding the reinforcement zig. Related methods are also provided.