Wafer Lock Chamber Cooling Plate for High-Temperature Transfer

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Solution Overview

Problem

The existing vacuum processing apparatus faces inefficiencies in wafer transport and processing due to uneven operations, high-temperature wafer handling, and corrosion issues from halogen gas residues, leading to reduced productivity and wafer damage.

Innovation Solution

The apparatus includes an atmosphere transport chamber, vacuum transport chambers, a lock chamber with a pusher arm and cooling plate for precise wafer handling and temperature control, and a controller for optimizing transport operations, ensuring efficient processing and storage of wafers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If wafers are transported and processed in parallel between lock chamber and vacuum processing chamber, then productivity is improved, but high-temperature wafers cause bottlenecks in the lock chamber

Engineering Contradiction:
Improvenumber of wafers processed per unit timeVSAvoidwafer transport operation
Core Design Contradiction:
ProductivityVSEase of operation

Solution Approach 1:

The lock chamber is divided into a first lock chamber and a second lock chamber that operate independently. The first lock chamber handles wafer transport between the atmosphere transport chamber and vacuum transport chamber, while the second lock chamber handles wafer transport between the atmosphere transport chamber and vacuum processing chamber. This segmentation allows parallel processing of multiple wafers without mutual interference, resolving the bottleneck problem.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A transfer chamber is introduced as an intermediary between the lock chambers and vacuum processing chamber. This transfer chamber receives processed wafers from the vacuum processing chamber and transfers them to the second lock chamber, enabling the lock chamber to prepare for the next wafer while the previous wafer is being processed, thus eliminating waiting time and bottlenecks.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If halogen gas is used for etching process, then processing capability is improved, but gas residues cause corrosion of wafer and damage to membrane structure

Engineering Contradiction:
Improveetching processing capabilityVSAvoidcorrosion and wafer damage
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

A gas residue removal unit is provided that includes a heating unit and a cooling unit. The heating unit heats the wafer to desorb halogen gas residues from the wafer surface and chamber walls, while the cooling unit cools the wafer after heating. This extraction and removal of harmful gas residues prevents corrosion and damage to the wafer and membrane structure.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The gas residue removal process is performed as a preliminary action before the wafer is transferred to the atmosphere transport chamber. By removing gas residues while the wafer is still in the vacuum environment, the wafer is protected from corrosion when exposed to atmospheric moisture, preventing damage to the membrane structure.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If wafer transport control is optimized, then processing efficiency is improved, but uneven operations in different units create waiting time

Engineering Contradiction:
Improveprocessing efficiencyVSAvoidtransport waiting time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

Multiple lock chambers and vacuum transport chambers are configured to operate in parallel, allowing continuous wafer processing without idle waiting time. While one lock chamber is transferring a wafer, another can be loading or processing, ensuring that the system continuously performs useful actions without interruption or bottleneck.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system dynamically assigns wafers to different lock chambers and transport paths based on real-time operational status. The controller monitors the state of each unit and dynamically adjusts the transport path and timing to balance the workload across all units, preventing any single unit from becoming a bottleneck and eliminating waiting time.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances productivity and processing efficiency by minimizing wafer damage and corrosion, while optimizing the handling and storage of high-temperature wafers, thereby improving the overall performance of the vacuum processing apparatus.

Implementation Method 1

a cooling plate disposed in a bottom portion of the at least one lock chamber for cooling the wafer

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS12014908B2Vacuum processing apparatus
Publication Date: 2024.06.18 HITACHI HIGH TECH CORP
  • US12014908B2 patent drawing
  • US12014908B2 patent drawing
  • US12014908B2 patent drawing

AI summary

A vacuum processing apparatus with improved processing efficiency, which includes a pusher arm to support the wafer on a beam portion, or deliver the supported wafer, and a cooling plate disposed on a bottom in the lock chamber for cooling the wafer and placed on tip ends of multiple support pins. The pusher arm includes four pusher pins disposed around a center of the wafer to be placed on the horizontally extending beam portion, and a drive unit connected to the proximal part for vertically moving the beam portion. The cooling plate includes a recess portion in its center, into which the beam portion of the pusher arm which has been moved downward is stored. The support pins are positioned closer to an outer circumference side of the wafer on the cooling plate with respect to the center than the pusher pins of the pusher arm.