Wafer Separation Apparatus Using Segmented Fluid Ejection

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Solution Overview

Problem

Existing processing apparatuses risk rupturing wafers due to pressure from ejected mixed fluids, while attempts to speed up separation, such as gradually increasing fluid ejection, result in prolonged processing times.

Innovation Solution

A processing apparatus with a chuck table, fluid communication passages, and regulating valves for water and air flow rates, controlled by a unit that uses water to space the wafer from the holding surface and then increases air flow to safely lift it without rupture.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If mixed fluid is ejected from the holding surface to separate the wafer, then the wafer can be separated from the holding surface, but the wafer tends to be ruptured by the pressure of the mixed fluid

Engineering Contradiction:
Improvewafer separation speedVSAvoidwafer integrity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The fluid ejection process is segmented into two distinct phases: first water is ejected to space the wafer from the holding surface, then air is ejected to lift the delivery unit. This segmentation allows each phase to perform its specific function optimally without causing damage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Water is ejected first as a preliminary action to create spacing between the wafer and holding surface before air is introduced for lifting. This preliminary spacing prevents the wafer from being in direct contact with high-pressure air that could cause rupture.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the amount of mixed fluid is gradually increased to avoid wafer rupture, then the wafer can be separated safely, but it takes time to separate the processed wafer from the holding surface

Engineering Contradiction:
Improvewafer integrityVSAvoidseparation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The separation process is divided into two sequential steps: water ejection for spacing and air ejection for lifting. This segmentation enables rapid separation by using water's lower pressure to create space quickly, then using air's higher pressure to complete the lifting without risking wafer damage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Water is ejected as a preliminary action to create spacing before air is introduced. This preliminary spacing allows the subsequent air ejection to occur at higher flow rates without directly impacting the wafer, thus reducing overall separation time while maintaining safety.

Inventive Principle:
Principle #10Preliminary action

3Speed

If high pressure mixed fluid is used to quickly separate the wafer, then separation speed increases, but the wafer is ruptured by the pressure

Engineering Contradiction:
Improveseparation speedVSAvoidpressure damage to wafer
Core Design Contradiction:
SpeedVSObject-affected harmful factors

Solution Approach 1:

The fluid ejection is segmented into water first (lower pressure) for spacing, then air (higher pressure) for lifting. This segmentation allows high separation speed through the air phase while the water phase prevents direct high-pressure contact with the wafer, avoiding damage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Water acts as an intermediary substance between the high-pressure air system and the wafer. By ejecting water first to create spacing, it mediates the interaction between the subsequent high-pressure air ejection and the wafer, preventing direct high-pressure contact that would cause rupture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS11667003B2Processing apparatus
Publication Date: 2023.06.06 DISCO CORP
  • US11667003B2 patent drawing
  • US11667003B2 patent drawing
  • US11667003B2 patent drawing

AI summary

A wafer held on a delivery pad is lifted from a holding surface, and when a lower surface of the wafer has been spaced in its entirety from the holding surface, an air flow rate regulating valve is opened to eject air from the holding surface. As the distance between the holding surface and the wafer spaced from the holding surface increases by lifting of a delivery unit, the degree of opening of the air flow rate regulating valve is adjusted to increase a flow rate of air from the holding surface, thereby spacing the wafer from the holding surface in a short period of time without rupturing the wafer.