Wavy Fin Shield for PVD Chamber Deposition
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Solution Overview
Problem
Conventional physical vapor deposition (PVD) processes face challenges in maintaining high target to substrate spacing while minimizing re-sputtering of the grounded shield, leading to contamination and reduced deposition rates due to uneven voltage distribution between the target and shield.
Innovation Solution
The use of a shield with an inner wall featuring a first wavy fin configuration on the upper portion and a second wavy fin configuration on the bottom portion, increasing the surface area to 1400-1410 in², which helps in reducing the potential difference to the grounded shield and minimizing re-sputtering by maintaining a higher negative self-bias on the target.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stress or pressure
If extremely wide body chambers are used to increase anode area and obtain higher negative self-bias on targets, then the self-bias magnitude is improved, but the footprint of the PVD chamber increases
Solution Approach 1:
The patent transforms the problem from a two-dimensional plane expansion (wider chamber) to a three-dimensional solution by adding vertical complexity through wavy fin configurations on the shield. This increases the effective anode surface area without expanding the chamber footprint, resolving the contradiction between achieving higher negative self-bias and maintaining a compact chamber size.
Solution Approach 2:
The wavy fin configurations introduce curved surfaces on the shield structure, replacing flat surfaces with undulating geometries. This curvature increases the surface area of the anode (shield) that contributes to plasma generation and negative self-bias development, allowing higher self-bias magnitudes within a smaller chamber footprint.
2Productivity
If high negative self-bias is maintained on the target to increase sputtering rate, then deposition rate is improved, but re-sputtering of the shield increases causing contamination
Solution Approach 1:
The patent applies different wavy fin configurations to different regions of the shield (upper portion vs. lower portion), creating local variations in surface area and plasma distribution. This localized differentiation allows optimization of the plasma sheath distribution to maintain high negative self-bias on the target while reducing the electric field intensity at the shield surface, thereby minimizing re-sputtering and contamination.
Solution Approach 2:
By changing the geometric parameters of the shield (introducing wavy fin configurations with specific dimensions and patterns), the patent modifies the electric field distribution and plasma density profiles. This parameter optimization enables maintaining high deposition rates through sustained negative self-bias while simultaneously reducing the conditions that lead to shield re-sputtering and contamination.
3Stress or pressure
If the surface area of the shield is increased to reduce potential difference to grounded shield, then voltage distribution is improved, but the complexity of shield configuration increases
Solution Approach 1:
The shield is segmented into distinct regions (upper portion and lower portion) with different wavy fin configurations. This segmentation allows each region to be optimized for specific functions: the upper portion configuration addresses potential difference reduction, while the lower portion configuration addresses re-sputtering minimization. The modular segmented design manages complexity by dividing the shield into functional zones rather than requiring a uniformly complex structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances deposition rates up to 10 angstroms/second while maintaining high ionization levels and reduces contamination by minimizing re-sputtering of the shield, thereby improving the overall efficiency of the PVD process.
Implementation Method 1
an RF power source to form a plasma within the chamber body
Implementation Method 2
physical vapor deposition chamber
Data Source
AI summary
Methods and apparatus for processing a substrate using improved shield configurations are provided herein. For example, a process kit for use in a physical vapor deposition chamber comprises a shield comprising an inner wall comprising an upper portion having a first wavy fin configuration and a bottom portion having a second wavy fin configuration different from the first wavy fin configuration such that a surface area of the shield is about 1400 in2 to about 1410 in2.


