Wiring Quality Test Topology Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The manual inspection and post-simulation verification methods for testing wiring quality in integrated circuits are excessively time-consuming and difficult, especially with the increasing complexity of semiconductor technology and the large number of signal lines in modern integrated circuits.
Innovation Solution
A method and apparatus for automatically determining the wiring result topological structure and expected topological structure based on connection points in the wiring layout, comparing these structures to identify inappropriate wiring, and generating a quality test report, thereby facilitating quick and efficient testing of wiring quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual inspection and post-simulation verification are used to test wiring quality, then measurement precision can be maintained, but testing time becomes excessively long
Solution Approach 1:
The patent applies preliminary action by extracting topological structure information from the wiring layout before actual wiring is performed. The expected topological structure is predetermined based on connection points, allowing for pre-comparison and early detection of wiring issues before they propagate through the design process, thus reducing subsequent testing time while maintaining accuracy
Solution Approach 2:
The patent creates a topological structure copy of the wiring layout that abstracts the essential connection relationships. This copied topological representation can be quickly compared against expected structures without requiring full-scale simulation or manual inspection of the complete wiring design, significantly reducing testing time while preserving measurement precision through structural analysis
2Adaptability or versatility
If the number of electronic components and wiring complexity increases in integrated circuits, then circuit functionality is improved, but wiring quality test difficulty increases
Solution Approach 1:
The patent segments the complex wiring quality test problem into distinct topological structure comparisons. By dividing the wiring layout into individual topological representations based on connection points and signal paths, the system can analyze each segment independently, making the testing process manageable even as overall circuit complexity increases
Solution Approach 2:
The patent introduces topological structure information as an intermediary representation between the physical wiring layout and the quality assessment process. This intermediary topological model simplifies the complexity by abstracting essential connection relationships, making it easier to detect and measure wiring quality issues in complex integrated circuits without directly analyzing every physical wiring detail
Data Source
AI summary
A wiring quality test method includes the following: a respective wiring result topological structure and a respective expected topological structure corresponding to each signal to be tested in a set of signals to be tested are determined based on a wiring layout; for each signal to be tested, the wiring result topological structure is compared with the expected topological structure, to obtain a topological structure comparison result corresponding to the signal to be tested; in response to determining that the topological structure comparison result is greater than a preset threshold, it is determined a test result indicating that wiring for the signal to be tested is inappropriate; and a quality test report is generated based on test results of the signals to be tested.