Wordline Defect Detection Using Multi-Time Sensing in 3D Memory
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Solution Overview
Problem
Existing semiconductor-based storage devices face challenges in accurately determining defects in wordlines, which can affect data processing reliability and efficiency, particularly in high-integration three-dimensional memory devices.
Innovation Solution
The storage device employs a method of applying a voltage of a first level to a wordline and performing multiple sensing operations at different times to temporarily store sensing data in page buffers, allowing for cell counting operations to detect defects by comparing cell counts and sensing data obtained at varying times.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple sensing operations are performed at different times to detect wordline defects, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent applies preliminary action by performing a first sensing operation at a first time to obtain initial sensing data before performing a second sensing operation at a second time. This preliminary sensing allows the system to establish a baseline state of the wordline, enabling more accurate defect detection through comparison while optimizing the timing sequence to minimize overall detection time.
Solution Approach 2:
The patent implements periodic action by conducting multiple sensing operations at different time points (first time and second time) with specific voltage levels applied to the wordline. This periodic sensing approach enables the system to capture temporal variations in wordline behavior, improving defect detection precision by comparing sensing data obtained at different moments in the operation cycle.
2Measurement precision
If voltage is applied to wordline at different stabilization times, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent applies dynamics by varying the stabilization time for voltage application to the wordline across different sensing operations. The control logic dynamically adjusts the timing of voltage application and sensing data acquisition, allowing the system to optimize measurement precision for different wordline states while managing complexity through adaptive control rather than fixed rigid timing sequences.
Solution Approach 2:
The patent implements parameter changes by modifying the voltage level and stabilization time parameters applied to the wordline during different sensing operations. By changing these parameters systematically (first voltage level at first stabilization time, second voltage level at second stabilization time), the system improves sensing data accuracy through multiple measurement conditions while the control logic manages the parameter variations in an organized manner.
Data Source
AI summary
Provided is a storage device including a memory device including a plurality of memory blocks, the memory device being configured to store data or read data, and at least one processor configured to control the memory device and to execute a data input/output request from a host, wherein the memory device further includes a row decoder configured to apply a voltage of a first level to a first wordline, and a plurality of page buffers, wherein, based on the voltage of the first level being applied to the first wordline, the plurality of page buffers are configured to temporarily store first sensing data sensed from a plurality of bitlines at a first time and second sensing data sensed from the plurality of bitlines at a second time after the first time.