Solid-State X-Ray Detector Bias Maintenance Circuit
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Solution Overview
Problem
The existing solid-state x-ray detectors require scrubbing to maintain bias and reduce lag, which is inefficient and consumes power, leading to non-productive overhead and access time latency before exposure.
Innovation Solution
A system and method that couples a first semiconductor device to a second semiconductor device, allowing for the removal of the need to scrub the detector by applying specific potentials to the second semiconductor device during activation, thereby eliminating the need for scrubbing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If scrubbing is performed to maintain bias and reduce lag, then detector reliability is improved, but power consumption increases and productivity decreases
Solution Approach 1:
The patent extracts the bias maintenance function from the periodic scrubbing operation by introducing a dedicated bias maintenance circuit that continuously maintains the photodiode bias voltage without requiring full detector readout and scrub cycles, thereby eliminating the power consumption and productivity loss associated with frequent scrubbing while maintaining detector reliability
Solution Approach 2:
The bias maintenance circuit provides self-service by automatically maintaining the photodiode bias voltage through a dedicated circuit that operates independently of the main detector readout and scrubbing operations, eliminating the need for periodic scrubbing interventions and reducing overall power consumption
2Reliability
If scrubbing is performed to maintain bias and reduce lag, then detector reliability is improved, but access time latency increases
Solution Approach 1:
The patent extracts the bias maintenance function from the periodic scrubbing operation by introducing a dedicated bias maintenance circuit that continuously maintains the photodiode bias voltage without requiring full detector readout and scrub cycles, thereby eliminating the access time latency associated with scrubbing while maintaining detector reliability
Solution Approach 2:
The bias maintenance circuit performs preliminary action by continuously maintaining the photodiode bias voltage in advance, eliminating the need for periodic scrubbing operations that would otherwise be required to restore bias conditions, thereby removing access time latency before exposure
3Reliability
If scrubbing is performed to maintain switch thresholds, then detector reliability is improved, but productivity decreases
Solution Approach 1:
The patent extracts the switch threshold maintenance function from the periodic scrubbing operation by introducing a dedicated bias maintenance circuit that continuously maintains the photodiode bias voltage and switch thresholds without requiring full detector readout and scrub cycles, thereby eliminating productivity loss while maintaining switch threshold stability
Solution Approach 2:
The bias maintenance circuit provides continuous useful action by continuously maintaining the photodiode bias voltage and switch thresholds through a dedicated circuit that operates independently of the main detector readout and scrubbing operations, eliminating periodic interruptions and maximizing detector availability and productivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the time and power required for detector scrubbing, minimizing latency and conserving power, especially in low-power applications, by eliminating the need for scrubbing altogether.
Implementation Method 1
The CsI absorbs x-rays and converts the x-rays to light, which is detected by the photodiodes
Implementation Method 2
Each photodiode, due to its construction, acts as a capacitor and stores charge
Data Source
AI summary
A system for reading data is provided. The system includes a detector having an array of first semiconductor devices, an array of second semiconductor devices, and an array of photodiodes. The array of photodiodes is coupled to the array of first semiconductor devices and the array of second semiconductor devices.