X-Ray Source Beam Deflection for Target Thermal Stability

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Solution Overview

Problem

Existing X-ray sources face challenges in reducing the thermal load on the target element during brief interruptions or standby operations, leading to potential cooling and thermal drift issues.

Innovation Solution

An X-ray source with a deflection device that intermittently deflects the electron beam outside the center or impact region of the target element, and a catching device to redirect and convert the electron beam's energy, reducing the target element's load and preventing cooling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If the electron beam is continuously directed at the target element during standby operation, then the target element remains thermally loaded and temperature is maintained, but the thermal drift of the target element occurs and the load on the target material increases

Engineering Contradiction:
Improvetarget element temperatureVSAvoidthermal drift
Core Design Contradiction:
TemperatureVSObject-affected harmful factors

Solution Approach 1:

The patent segments the target element into multiple regions with different target materials arranged in different spatial locations. The electron beam can be selectively directed to different regions, allowing the beam to move between impact points rather than continuously loading a single center region. This spatial segmentation enables thermal management by distributing the thermal load across multiple areas.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements periodic deflection of the electron beam using deflection devices that intermittently redirect the beam away from the target element's center region. During standby operation, the beam is periodically deflected to trace patterns (such as Archimedean spirals) or directed to peripheral regions, creating a periodic on-off loading pattern that maintains average temperature while preventing localized thermal drift.

Inventive Principle:
Principle #19Periodic action

2Object-affected harmful factors

If the electron beam is deflected outside the target element during interruptions, then the load on the target material is reduced, but the electron beam energy needs to be managed to prevent glass body loading and ensure thermal coupling

Engineering Contradiction:
Improvetarget material loadVSAvoidelectron beam energy
Core Design Contradiction:
Object-affected harmful factorsVSLoss of energy

Solution Approach 1:

The patent introduces a catching device as an intermediary component positioned outside the target element to intercept the deflected electron beam. This catching device serves as a mediator that safely absorbs the electron beam energy when the beam is redirected away from the target during standby or interruption periods, preventing the energy from damaging the glass body while maintaining thermal coupling through conduction to the anode body.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent converts the potentially harmful deflected electron beam (which would otherwise damage the glass body) into a beneficial thermal source for the anode body. The catching device captures the beam energy and transfers it as heat to the anode body through thermal conduction, transforming what would be wasted or harmful energy into useful thermal energy that helps maintain system temperature.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Adaptability or versatility

If multiple target materials are used in different regions, then different types of X-radiation can be generated, but the device complexity increases

Engineering Contradiction:
ImproveX-radiation typeVSAvoidtarget element structure
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent creates a universal target element structure that can generate multiple types of X-radiation by incorporating different target materials (such as tungsten, molybdenum, rhodium, or chromium) in different regions of the same target element. This multi-functional design allows a single target element to serve multiple purposes, enabling the generation of different X-ray spectra and characteristics without requiring separate target elements for each application.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration minimizes thermal drift and maintains the target element's temperature, allowing for efficient operation during interruptions and standby modes while reducing the load on the target material.

Implementation Method 1

an electron source for providing electrons in the form of an electron beam

Methodology Applied
Scientific EffectElectron beam: Electron Beam

Implementation Method 2

at least one deflection device through which the electron beam can be deflected from a direction of propagation generated by the electron source

Methodology Applied
Scientific EffectElectromagnetic deflection: Lorentz Force

Implementation Method 3

a target element which can be impinged upon with the electrons of the electron beam

Methodology Applied
Scientific EffectBremsstrahlung radiation: X-Ray

Data Source

PatentUS20240055216A1X-ray source and operating method therefor
Publication Date: 2024.02.15 HELMUT FISCHER GMBH & CO INSTITUT FUER ELEKTRONIK UND MESTECHNIK
  • US20240055216A1 patent drawing
  • US20240055216A1 patent drawing
  • US20240055216A1 patent drawing

AI summary

The invention relates to an x-ray source (100; 100a; 100b; 100c), comprising an electron source (110) for providing electrons (e) in the form of an electron beam (es) and a target element (120), on which the electrons (e) of the electron beam (es) of the electron source (110) are able to impinge, and at least one deflection device (140) enabling the electron beam (es) to be deflected from a propagation direction produced by the electron source (110), wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently with a trajectory (180) incident on the target element (120), but outside a center of the target element (120) or a region (150) of the target element (120) on which the electron beam (es) is incident in the case of a propagation direction without deflection, or wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently in such a way that the electron beam (es) is not incident on the target element (120).