Digital X-ray Detector Pin Structure for Line Defect Prevention

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Solution Overview

Problem

Conventional digital x-ray detectors suffer from line defects due to short circuits between adjacent lines during the manufacturing process, rendering affected pixels unable to convert x-rays into electrical signals.

Innovation Solution

A method and structure for manufacturing digital x-ray detectors where thin film transistors are formed on every sensing pixel area, with specific pin structures, data and bias wires, and protective layers to prevent electrical connections between odd and even number lines, and a light shield film is used to shield the active layer, preventing short circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional manufacturing process is used, then manufacturing simplicity is maintained, but line defects occur due to short circuits between adjacent lines

Engineering Contradiction:
Improveline defect preventionVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The manufacturing process is segmented into distinct stages: forming pin structures on odd lines, forming protective layers, forming pin structures on even lines. This segmentation allows each stage to be controlled independently, preventing short circuits between adjacent lines while maintaining systematic manufacturing efficiency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Pin structures are formed in advance on odd-numbered lines before even-numbered lines are processed. This preliminary action ensures that when even lines are subsequently formed, the odd lines already have protective pin structures in place, preventing short circuits before they can occur

Inventive Principle:
Principle #10Preliminary action

2Reliability

If particles are present between lines during manufacturing, then contamination is introduced, but short circuits occur between adjacent lines

Engineering Contradiction:
Improveshort circuit preventionVSAvoidparticle contamination
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

Pin structures serve as intermediary elements between adjacent data lines. These pin structures act as mediators that prevent direct contact between particles on adjacent lines, thereby preventing short circuits even when particle contamination is present during manufacturing

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Protective pin structures are formed beforehand on alternating lines to cushion against the harmful effects of particle contamination. This prior cushioning ensures that even if particles are introduced during manufacturing, they cannot cause short circuits between the protected lines

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively prevents line defects by ensuring that even if particles are present between lines, they do not cause short circuits, allowing all pixels to function correctly and convert x-rays into electrical signals.

Implementation Method 1

The direct method is a method of using external power supply to collect electrons and pairs of positive holes being generated in an x-ray receptor layer constituting a digital x-ray detector as the x-ray that penetrated a human body enters the x-ray receptor layer

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS9588237B2Digital X-ray detector and method for manufacturing the X-ray detector
Publication Date: 2017.03.07 HYDIS TECH CO LTD
  • US9588237B2 patent drawing
  • US9588237B2 patent drawing
  • US9588237B2 patent drawing

AI summary

Provided herein is a digital x-ray detector wherein a plurality of sensing pixels are formed in a matrix structure, and wherein a pin structure positioned in an odd number line and a pin structure positioned in an even number line are not formed in the same process, thereby preventing a line detect by a particle.